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Huang et al., 2016 - Google Patents

Low noise digitizer design for LCLS-II LLRF

Huang et al., 2016

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Document ID
1649500109079957151
Author
Huang G
Doolittle L
Xu Y
Yang J
et al.
Publication year
Publication venue
NAPAC2016, Chicago, IL

External Links

Snippet

Modern accelerators use a digital low level RF controller to stabilize the fields in accelerator cavities. The noise in the receiver chain and analog to digital conversion (ADC) for the cavity probe signal is critically important. Within the closedloop bandwidth, it will eventually …
Continue reading at s3.cern.ch (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuit
    • G01R31/31903—Tester hardware, i.e. output processing circuit tester configuration

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