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Todd et al., 1989 - Google Patents

The high temperature creep deformation of Si3N4-6Y2O3-2Al2O3

Todd et al., 1989

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Document ID
16465467198932459384
Author
Todd J
Xu Z
Publication year
Publication venue
Journal of materials science

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Snippet

The creep properties of silicon nitride containing 6 wt% yttria and 2 wt% alumina have been determined in the temperature range 1573 to 1673 K. The stress exponent, n, in the equation ̇ ε∝ σ n was determined to be 2.00±0.15 and the true activation energy was …
Continue reading at ntrs.nasa.gov (PDF) (other versions)

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