Todd et al., 1989 - Google Patents
The high temperature creep deformation of Si3N4-6Y2O3-2Al2O3Todd et al., 1989
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- 16465467198932459384
- Author
- Todd J
- Xu Z
- Publication year
- Publication venue
- Journal of materials science
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The creep properties of silicon nitride containing 6 wt% yttria and 2 wt% alumina have been determined in the temperature range 1573 to 1673 K. The stress exponent, n, in the equation ̇ ε∝ σ n was determined to be 2.00±0.15 and the true activation energy was …
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