[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Federico et al., 2023 - Google Patents

An Open Hemispherical Resonant Cavity for Relative Permittivity Measurements of Fluid and Solid Materials at mm-Wave Frequencies

Federico et al., 2023

Document ID
16108395228788910172
Author
Federico G
Caratelli D
Smolders A
Reniers A
Publication year
Publication venue
2023 53rd European Microwave Conference (EuMC)

External Links

Snippet

In this paper, we present a hemispherical Fabry-Pérot open cavity resonator based measurement technique to estimate the relative permittivity of dielectric materials. The open cavity is realized by combining a spherical and a planar mirror, suitable for the …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/10—Radiation diagrams of aerials; Antenna testing in general
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants; Measuring impedance or related variables
    • G01R27/2617—Measuring dielectric properties, e.g. constants
    • G01R27/2635—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P1/00—Auxiliary devices
    • H01P1/24—Terminating devices
    • H01P1/26—Dissipative terminations

Similar Documents

Publication Publication Date Title
Catala-Civera et al. Accurate determination of the complex permittivity of materials with transmission reflection measurements in partially filled rectangular waveguides
Wang et al. Broadband printed-circuit-board characterization using multimode substrate-integrated-waveguide resonator
Wang et al. Characterization of dielectric materials at WR-15 band (50–75 GHz) using VNA-based technique
Costa et al. Waveguide dielectric permittivity measurement technique based on resonant FSS filters
Subbaraj et al. Electromagnetic nondestructive material characterization of dielectrics using EBG based planar transmission line sensor
Li et al. Compact dielectric constant characterization of low-loss thin dielectric slabs with microwave reflection measurement
Raveendran et al. Complex permittivity extraction of planar dielectrics using a noninvasive microwave transmission line resonant technique
Maode et al. An improved open-ended waveguide measurement technique on parameters/spl epsiv//sub/spl gamma//and/spl mu//sub/spl gamma//of high-loss materials
Suzuki et al. Millimeter-wave measurement of complex permittivity by perturbation method using open resonator
Shi et al. Complex permittivity measurement utilizing multiple modes of a rectangular cavity
Nishikata A swept-frequency measurement of complex permittivity and complex permeability of a columnar specimen inserted in a rectangular waveguide
Egorov et al. Dielectric constant, loss tangent, and surface resistance of PCB materials at K-band frequencies
Federico et al. An Open Hemispherical Resonant Cavity for Relative Permittivity Measurements of Fluid and Solid Materials at mm-Wave Frequencies
You et al. Non-destructive dielectric measurements and calibration for thin materials using waveguide-coaxial adaptors
Dvorsky et al. Microwave surface conductivity measurement using an open-ended circular waveguide probe
Felbecker et al. Estimation of permitivitty and loss tangent of high frequency materials in the millimeter wave band using a hemispherical open resonator
Kanitkar et al. A comparative analysis of two dielectric extraction methods of a PCB material for D-band applications
Kapilevich et al. Microwave characterization of powders using multiresonance cell
Li et al. Design of a cylindrical cavity resonator for measurements of electrical properties of dielectric materials
Zhu et al. Determination of propagation constant of terahertz dielectric ridge waveguide using noncontact measurement approach
Parkhomenko et al. The improved resonator method for measuring the complex permittivity of materials
Tamyis et al. Free space measurement of complex permittivity and complex permeability of magnetic materials using open circuit and short circuit method at microwave frequencies
Wu et al. Permittivity Measurement From 40 to 70 GHz Using a DC FPOR With a Fixed Specimen Holder and an Off-Axial Feed
Hasar Thickness-independent complex permittivity determination of partially filled thin dielectric materials into rectangular waveguides
Gevorkyan et al. External Fields Boundaries Estimation of High-Q Shielded Dielectric Resonator