Nahm, 2005 - Google Patents
Influence of La2O3 additives on microstructure and electrical properties of ZnO-Pr6O11-CoO-Cr2O3-La2O3-based varistorsNahm, 2005
- Document ID
- 1600740088202606013
- Author
- Nahm C
- Publication year
- Publication venue
- Materials Letters
External Links
Snippet
The microstructure and electrical properties of the varistors, which are composed of ZnO- Pr6O11-CoO-Cr2O3-La2O3 (ZPCCL)-based ceramics, were investigated with various La2O3 contents. The increase of La2O3 content led to more densified ceramics, whereas …
- 239000000654 additive 0 title description 6
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies; Multistep manufacturing processes therefor characterised by the materials of which they are formed
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions; characterised by the concentration or distribution of impurities within semiconductor regions
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
- H01C7/10—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material voltage responsive, i.e. varistors
- H01C7/105—Varistor cores
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/06—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors mainly consisting of other non-metallic substances
- H01B1/08—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors mainly consisting of other non-metallic substances oxides
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Nahm | The nonlinear properties and stability of ZnO-Pr6O11-CoO-Cr2O3-Er2O3 ceramic varistors | |
Nahm et al. | Microstructure and electrical properties of Y2O3-doped ZnO–Pr6O11-based varistor ceramics | |
Meng et al. | Improving electrical properties of multiple dopant ZnO varistor by doping with indium and gallium | |
Nahm | The electrical properties and dc degradation characteristics of Dy2O3 doped Pr6O11-based ZnO varistors | |
Meng et al. | Tailoring low leakage current and high nonlinear coefficient of a Y-doped ZnO varistor by indium doping | |
Nahm et al. | Highly stable nonlinear properties of ZnO–Pr6O11–CoO–Cr2O3–Y2O3-based varistor ceramics | |
Meng et al. | High voltage gradient and low residual-voltage ZnO varistor ceramics tailored by doping with In2O3 and Al2O3 | |
Nahm | Electrical properties and stability of praseodymium oxide-based ZnO varistor ceramics doped with Er2O3 | |
Chen et al. | Microstructure and electrical properties of Dy2O3-doped ZnO–Bi2O3 based varistor ceramics | |
Nahm | Effect of MnO2 addition on microstructure and electrical properties of ZnO–V2O5-based varistor ceramics | |
Meng et al. | Indium tailors the leakage current and voltage gradient of multiple dopant-based ZnO varistors | |
Nahm | The effect of sintering temperature on varistor properties of (Pr, Co, Cr, Y, Al)-doped ZnO ceramics | |
Nahm | Influence of La2O3 additives on microstructure and electrical properties of ZnO-Pr6O11-CoO-Cr2O3-La2O3-based varistors | |
Nahm | Microstructure and electrical properties of Dy2O3-doped ZnO–Pr6O11-based varistor ceramics | |
Nahm | Effect of sintering temperature on nonlinear electrical properties and stability against DC accelerated aging stress of (CoO, Cr2O3, La2O3)-doped ZnO–Pr6O11-based varistors | |
Nahm | The effect of sintering temperature on electrical properties and accelerated aging behavior of PCCL-doped ZnO varistors | |
Meng et al. | Tailoring electrical properties of multiple dopant-based ZnO varistor by doping with yttrium, gallium, and indium | |
Meng et al. | Low-residual-voltage ZnO varistor ceramics improved by multiple doping with gallium and indium | |
Nahm | Effect of sintering temperature on microstructure and electrical properties of Zn· Pr· Co· Cr· La oxide-based varistors | |
Bai et al. | Influence of Bi-Co-O synthetic multi-phase on electrical properties of the ZnO-Bi2O3-MnO2–SiO2 varistors | |
Wang et al. | Electrical properties and AC degradation characteristics of low voltage ZnO varistors doped with Nd2O3 | |
Nahm et al. | Electrical properties and DC-accelerated aging behavior of ZnO–Pr6O11–CoO–Cr2O3–Dy2O3-based varistor ceramics | |
Nahm | Electrical properties and stability of Tb-doped zinc oxide-based nonlinear resistors | |
Nahm et al. | Effect of CoO on nonlinear electrical properties of praseodymia-based ZnO varistors | |
Nahm | Varistor properties of ZnO-Pr6O11-CoO-Cr2O3-Y2O3-In2O3 ceramics |