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Bhatnagar, 2002 - Google Patents

Design for Test

Bhatnagar, 2002

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Document ID
16003856549946149460
Author
Bhatnagar H
Publication year
Publication venue
Advanced ASIC Chip Synthesis Using Synopsys® Design Compiler™ Physical Compiler™ and PrimeTime®

External Links

Snippet

Chapter Summary DFT techniques are essential to an efficient and successful testing of the manufactured device. By implementing DFT features early in the design cycle, full test coverage on the design may be achieved, thereby reducing the debugging time normally …
Continue reading at citeseerx.ist.psu.edu (PDF) (other versions)

Classifications

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    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318555—Control logic
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    • G01R31/317—Testing of digital circuits
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    • G01R31/318572—Input/Output interfaces
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    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
    • G—PHYSICS
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    • G01R31/318586—Design for test with partial scan or non-scannable parts
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    • G01R31/318558—Addressing or selecting of subparts of the device under test
    • G—PHYSICS
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    • G—PHYSICS
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    • G01R31/318566—Comparators; Diagnosing the device under test
    • G—PHYSICS
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    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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    • G01R31/318505—Test of Modular systems, e.g. Wafers, MCM's
    • G01R31/318508—Board Level Test, e.g. P1500 Standard
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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    • G—PHYSICS
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    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
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    • G—PHYSICS
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    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G—PHYSICS
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    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G—PHYSICS
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    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. varying supply voltage

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