Xu et al., 2021 - Google Patents
Fast dynamic frequency response-based multiparameter measurement in spin-exchange relaxation-free comagnetometersXu et al., 2021
- Document ID
- 15961567416251957499
- Author
- Xu Z
- Wei K
- Zhao T
- Cao Q
- Liu Y
- Hu D
- Zhai Y
- Publication year
- Publication venue
- IEEE Transactions on Instrumentation and Measurement
External Links
Snippet
As the measurement of multiple parameters in a spin-exchange relaxation-free (SERF) comagnetometer requires a long time and complex experimentation, we present a novel dynamic frequency response-based method for the accurate and rapid measurement of key …
- 238000005259 measurement 0 title abstract description 45
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/44—Arrangements or instruments for measuring magnetic variables involving magnetic resonance using nuclear magnetic resonance [NMR]
- G01R33/46—NMR spectroscopy
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
- G01R33/38—Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field
- G01R33/389—Field stabilisation, e.g. by field measurements and control means or indirectly by current stabilisation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
- G01R33/282—Means specially adapted for hyperpolarisation or for hyperpolarised contrast agents, e.g. for the generation of hyperpolarised gases using optical pumping cells, for storing hyperpolarised contrast agents or for the determination of the polarisation of a hyperpolarised contrast agent
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/24—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/26—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux using optical pumping
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
- G01R33/30—Sample handling arrangements, e.g. sample cells, spinning mechanisms
- G01R33/31—Temperature control thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/028—Electrodynamic magnetometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/035—Measuring direction or magnitude of magnetic fields or magnetic flux using superconductive devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/60—Arrangements or instruments for measuring magnetic variables involving magnetic resonance using electron paramagnetic resonance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
- G01N21/23—Bi-refringence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N24/00—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
- G01N24/08—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects by using nuclear magnetic resonance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00 and G01R33/00 - G01R35/00
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the preceding groups
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Li et al. | SERF atomic magnetometer–recent advances and applications: A review | |
Zhao et al. | Determination of spin polarization in spin-exchange relaxation-free atomic magnetometer using transient response | |
Allred et al. | High-sensitivity atomic magnetometer unaffected by spin-exchange relaxation | |
Fan et al. | Suppression of the bias error induced by magnetic noise in a spin-exchange relaxation-free gyroscope | |
Xu et al. | Fast dynamic frequency response-based multiparameter measurement in spin-exchange relaxation-free comagnetometers | |
JP5707021B2 (en) | Magnetic field measuring device | |
Zhang et al. | Optimal operating temperature of miniaturized optically pumped magnetometers | |
Wei et al. | Simultaneous determination of the spin polarizations of noble-gas and alkali-metal atoms based on the dynamics of the spin ensembles | |
Lu et al. | Suppression of light shift for high-density alkali-metal atomic magnetometer | |
Liu et al. | A fast measurement for relaxation rates and fermi-contact fields in spin-exchange relaxation-free comagnetometers | |
Jiang et al. | Examination of spin-exchange relaxation in the alkali metal-noble gas comagnetometer with a large electron magnetic field | |
Wei et al. | Accurate polarimetry of hybrid K-Rb and 21 Ne atoms based on spin-exchange interactions | |
Zhang et al. | On-site synchronous determination of coil constant and nonorthogonal angle based on electron paramagnetic resonance | |
Fu et al. | Effects of probe laser intensity on co-magnetometer operated in spin-exchange relaxation-free regime | |
Liu et al. | Suppression of low-frequency magnetic drift based on magnetic field sensitivity in k-rb-21 ne atomic spin comagnetometer | |
Zhao et al. | A non-modulated triaxial magnetic field compensation method for spin-exchange relaxation-free magnetometer based on zero-field resonance | |
Li et al. | Miniature wide-range three-axis vector atomic magnetometer | |
Yan et al. | Optical parameter decoupling and optimization for elliptically polarized atomic magnetometer | |
Pei et al. | Markov noise in atomic spin gyroscopes: Analysis and suppression based on allan deviation | |
Yin et al. | In-situ relaxation rate measurement in magnetic modulated atomic magnetometers | |
Pei et al. | Bandwidth expansion of atomic spin gyroscope with transient response | |
Xing et al. | A measurement method of transverse light-shift in atomic spin co-magnetometer | |
Liu et al. | Suppression of the bias error induced by vapor cell temperature in a spin-exchange relaxation-free gyroscope | |
Pang et al. | A highly sensitive in situ magnetic field fluctuation measurement method based on nuclear-spin depolarization in an atomic comagnetometer | |
Ma et al. | Measuring spin polarization of a spin-exchange relaxation-free atomic magnetometer at extremely large optical depths |