[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Yamaguchi et al., 2009 - Google Patents

A robust method for identifying a deterministic jitter model in a total jitter distribution

Yamaguchi et al., 2009

Document ID
15821092877205060526
Author
Yamaguchi T
Ichiyama K
Hou H
Ishida M
Publication year
Publication venue
2009 International Test Conference

External Links

Snippet

A new method for identifying a deterministic jitter (DJ) model in a total jitter (TJ) distribution is introduced in this paper. The new method is based on the characteristic function and identifies the DJ model from the given TJ PDF contaminated by an unknown DJ PDF …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. varying supply voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio Measuring jitter, i.e. phase noise
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L25/00—Baseband systems
    • H04L25/02—Details ; Arrangements for supplying electrical power along data transmission lines
    • H04L25/08—Modifications for reducing interference; Modifications for reducing effects due to line faults; Receiver end arrangements for detecting or overcoming line faults
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
    • H04L1/205—Arrangements for detecting or preventing errors in the information received using signal quality detector jitter monitoring
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/44—Arrangements or instruments for measuring magnetic variables involving magnetic resonance using nuclear magnetic resonance [NMR]
    • G01R33/46—NMR spectroscopy
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/24—Testing correct operation

Similar Documents

Publication Publication Date Title
US7158899B2 (en) Circuit and method for measuring jitter of high speed signals
Sunter et al. On-chip digital jitter measurement, from megahertz to gigahertz
US6832172B2 (en) Apparatus and method for spectrum analysis-based serial data jitter measurement
Ou et al. Jitter models for the design and test of Gbps-speed serial interconnects
US7305025B2 (en) Measurement instrument and measurement method
US7203610B2 (en) System and method of obtaining data-dependent jitter (DDJ) estimates from measured signal data
Kuo et al. Jitter models and measurement methods for high-speed serial interconnects
Yamaguchi et al. Extraction of instantaneous and RMS sinusoidal jitter using an analytic signal method
Yamaguchi et al. A robust method for identifying a deterministic jitter model in a total jitter distribution
US7363562B2 (en) Method and apparatus for deferred decision signal quality analysis
US7844022B2 (en) Jitter spectrum analysis using random sampling (RS)
US9429624B2 (en) Synchronous sampling of internal state for investigation of digital systems
Hansel et al. Implementation of an economic jitter compliance test for a multi-gigabit device on ATE
Sui et al. New methods to characterize deterministic jitter and crosstalk-induced jitter from measurements
Hong et al. An accurate jitter estimation technique for efficient high speed I/O testing
US20130070830A1 (en) Characterization of the jitter of a clock signal
Ishida et al. A jitter separation and BER estimation method for asymmetric total jitter distributions
Dou et al. Jitter decomposition in high-speed communication systems
Yamaguchi et al. An FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time
Kuznetsov et al. Bit error rate estimation based on the probabilistic model of the crosstalk voltage
Duan et al. Accurate jitter decomposition in high-speed links
Fan et al. A high accuracy high throughput jitter test solution on ATE for 3GBPS and 6gbps serial-ata
Kho et al. Fast and accurate technique to decompose jitter for very long pattern length waveform
Fan et al. An Accelerated Jitter Tolerance Test Technique on ATE for 1.5 GB/S and 3GB/S Serial-ATA
Hong et al. An efficient random jitter measurement technique using fast comparator sampling