[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Zemany et al., 1956 - Google Patents

Plating Thickness by the Attenuation of Characteristic X‐Rays

Zemany et al., 1956

View PDF
Document ID
15487367800984938509
Author
Zemany P
Liebhafsky H
Publication year
Publication venue
Journal of The Electrochemical Society

External Links

Snippet

When an x-ray beam of sufficient energy and intensity strikes a plated metal, it will excite a characteristic line of the substrate metal. Of the quanta excited, those properly oriented will pass through, or be absorbed by, the plating. As a consequence of the absorption, x-rays will …
Continue reading at citeseerx.ist.psu.edu (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation
    • G01N23/207—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation by means of diffractometry using detectors, e.g. using an analysing crystal or a crystal to be analysed in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation by means of diffractometry using detectors, e.g. using an analysing crystal or a crystal to be analysed in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material and measuring the absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission

Similar Documents

Publication Publication Date Title
Powell et al. Origin of the characteristic electron energy losses in aluminum
McDavid et al. Segregation at Cu Au alloy surfaces
Liebhafsky et al. Film thickness by X-ray emission spectrography
US3056027A (en) Apparatus for measuring the thickness of a deposit
Olsen et al. Influence of the incident beam on integrated intensities in X-ray energy-dispersive diffractometry
Zemany et al. Plating Thickness by the Attenuation of Characteristic X‐Rays
US2926257A (en) Method of measuring the thickness of thin coatings
Black et al. The structures of liquid mercury and liquid aluminum
Wählisch et al. Validation of secondary fluorescence excitation in quantitative X-ray fluorescence analysis of thin alloy films
Davenport et al. In situ X-ray absorption study of chromium valency changes in passive oxides on sputtered AlCr thin films under electrochemical control
Sofield et al. Energy straggling of 5.486-MeV alpha particles in Al
Balzarotti et al. Role of the density of conduction states on the L 2, 3 absorption spectrum of aluminum
Mackenzie Accurate metal and oxygen analyses of cuprate single crystals by electron probe microanalysis
Faust et al. Multiple compton scattering
Carter et al. Low energy X-ray mass absorption coefficients from 1.49 to 15.77 keV for scandium, titanium, vanadium, iron, cobalt, nickel and zinc
Lodding et al. Ion probe technique for the study of gallium diffusion in silicon nitride films
Gevers et al. Analysis of FeFs and NiFz Thin Films by Using RBS,(α, X) Reactions, and SIMS Measurements
Lennard et al. Measurements of thin oxide films of SiO2/Si (100)
US2890344A (en) Analysis of materials by x-rays
Platt Structure in the X-Ray K Absorption Edge of Metallic Potassium
Petrik et al. Characterization of ZnO structures by optical and X-ray methods
Maeda et al. Application of anomalous oxygen Kα 532 eV peak for the determination of metal oxide thickness
Braundmeier Jr et al. Intrinsic damping rate and volume plasmon energy in Mg from radiative decay measurements
Achey et al. A New Approach to the Measurement of Coating Thickness by Fluorescent X‐Ray Absorption
Shulakov et al. X-ray spectral analysis of the degradation of Au/Si interphase boundaries in air