[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Dikhoff et al., 1985 - Google Patents

Topographic PIXE analysis of platinum levels in kidney slices from CIS-platin treated patients

Dikhoff et al., 1985

Document ID
15038504446277151913
Author
Dikhoff T
Van der Heide J
McVie J
Publication year
Publication venue
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

External Links

Snippet

Concentrations of platinum and several other trace elements have been measured exploiting a 50× 50 μ proton beam for PIXE analysis. The thickness of a selective germanium absorber for the spectral resolution of platinum L β and selenium K α peaks …
Continue reading at www.sciencedirect.com (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material and measuring the absorption
    • G01N23/08—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material and measuring the absorption using electric detection means
    • G01N23/16—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material and measuring the absorption using electric detection means the material being a moving sheet or a sheet or tube examined by a scanning probe
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission
    • G01N23/221—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission by activation analysis
    • G01N23/222—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission by activation analysis using neutrons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by the preceding groups
    • G01N33/48—Investigating or analysing materials by specific methods not covered by the preceding groups biological material, e.g. blood, urine; Haemocytometers
    • G01N33/50—Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation

Similar Documents

Publication Publication Date Title
Johansson et al. Elemental trace analysis of small samples by proton induced X-ray emission
Gavrilov et al. Application of nuclear reaction analysis for aging investigations of detectors
Dikhoff et al. Topographic PIXE analysis of platinum levels in kidney slices from CIS-platin treated patients
Jundt et al. Proton-induced X-ray analysis of trace elements in tissue sections
Maeda et al. Multielemental analysis of human thyroid glands using particle induced X-ray emission (PIXE)
Khaliquzzaman et al. Trace element analysis in biological materials by external beam PIXE
Aebersold The production of a beam of fast neutrons
Rao et al. Coherent and incoherent scattering of 42.75 and 47.24 keV x‐ray photons scattered from Al, Cu, Y, Mo, Au and Pb
Raith et al. Trace element detection sensitivity in PIXE analysis by means of an external proton beam
JPH10221047A (en) Fluorescent x-ray film thickness analyzer and method
Jaklevic et al. APPLICATION OP X-RAY FLUORESCENCE TECHNIQUES TO MEASURE ELEMENTAL COMPOSITION OF PARTICLES IN THE ATMOSPHERE
Spatz et al. Optimization of a spectrometer for energy‐dispersive X‐ray fluorescence analysis by X‐ray tubes in combination with secondary targets for multielement determination
Bearse et al. Elemental variations in whole blood following gamma radiation injury of mice
Peisach et al. Evaluation of pixe-induced XRF for the analysis of steels and biological samples: comparison with tube-excited XRF
Avdeichikov et al. On-beam calibration of the ΔE (Si)–Sci/PD charged particle telescope
Valković et al. Comparison of different modes of excitation in X-ray emission spectroscopy in the detection of trace elements in coal and coal ash
Campbell et al. Precision of PIXE analysis of thin fluid-residue specimens using internal standards
Paradellis Determination of trace elements in whole blood by photon-induced X-ray fluorescence
Olivier et al. The use of the nuclear microprobe for the examination of nitrogen distributions in metal samples
Şahin et al. X-ray fluorescence intensity distribution in circular specimens
RU2825431C1 (en) Method of estimating total cross-section of interaction of material with thermal neutrons
Kaufman et al. A high intensity source of polarized x-rays for fluorescent excitation analysis (FEA)
Flint et al. The application of trace element analysis by x-ray fluorescence to human blood serum
Kvasniak et al. Improvements in the PIXE system of the CENTA laboratory with application in the contamination studies of tree rings in Slovakia
Şimşek et al. Inelastic and elastic scattering differential cross‐sections of 59.5 keV photons for Cu and Zn targets