[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Khan et al., 2018 - Google Patents

Area-selective atomic layer deposition using Si precursors as inhibitors

Khan et al., 2018

Document ID
14420230524230561335
Author
Khan R
Shong B
Ko B
Lee J
Lee H
Park J
Oh I
Raya S
Hong H
Chung K
Luber E
Kim Y
Lee C
Kim W
Lee H
Publication year
Publication venue
Chemistry of Materials

External Links

Snippet

Short-chain aminosilanes, namely, bis (N, N-dimethylamino) dimethylsilane (DMADMS) and (N, N-dimethylamino) trimethylsilane (DMATMS), have been used as Si precursors for atomic layer deposition (ALD) of SiO2. In this work, the DMADMS and DMATMS Si …
Continue reading at pubs.acs.org (other versions)

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45523Pulsed gas flow or change of composition over time
    • C23C16/45525Atomic layer deposition [ALD]
    • C23C16/45527Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/40Oxides

Similar Documents

Publication Publication Date Title
Khan et al. Area-selective atomic layer deposition using Si precursors as inhibitors
Soethoudt et al. Insight into selective surface reactions of dimethylamino-trimethylsilane for area-selective deposition of metal, nitride, and oxide
Minaye Hashemi et al. Selective deposition of dielectrics: Limits and advantages of alkanethiol blocking agents on metal–dielectric patterns
George Atomic layer deposition: an overview
Stevens et al. Area-selective atomic layer deposition of TiN, TiO2, and HfO2 on silicon nitride with inhibition on amorphous carbon
Song et al. Integrated isothermal atomic layer deposition/atomic layer etching supercycles for area-selective deposition of TiO2
Balasubramanyam et al. Area-selective atomic layer deposition of two-dimensional WS2 nanolayers
Mameli et al. Area-selective atomic layer deposition of ZnO by area activation using electron beam-induced deposition
Avila et al. Real-time observation of atomic layer deposition inhibition: Metal oxide growth on self-assembled alkanethiols
Kalanyan et al. Using hydrogen to expand the inherent substrate selectivity window during tungsten atomic layer deposition
Kim et al. Effects of Al precursors on deposition selectivity of atomic layer deposition of Al2O3 using ethanethiol inhibitor
Seo et al. Reaction mechanism of area-selective atomic layer deposition for Al2O3 nanopatterns
Groven et al. Two-dimensional crystal grain size tuning in WS2 atomic layer deposition: an insight in the nucleation mechanism
Cicero et al. Olefin Additions on H− Si (111): Evidence for a Surface Chain Reaction Initiated at Isolated Dangling Bonds
Lee et al. Inherently Area‐Selective Atomic Layer Deposition of SiO2 Thin Films to Confer Oxide Versus Nitride Selectivity
Oh et al. Role of precursor choice on area-selective atomic layer deposition
Hong et al. ALD resist formed by vapor-deposited self-assembled monolayers
Zyulkov et al. Selective Ru ALD as a catalyst for sub-seven-nanometer bottom-up metal interconnects
Merkx et al. Relation between reactive surface sites and precursor choice for area-selective atomic layer deposition using small molecule inhibitors
Sampson et al. Inhibiting metal oxide atomic layer deposition: beyond zinc oxide
Yarbrough et al. Tuning molecular inhibitors and aluminum precursors for the area-selective atomic layer deposition of Al2O3
Chopra et al. Selective growth of titanium nitride on HfO2 across nanolines and nanopillars
Knapas et al. In situ reaction mechanism studies on atomic layer deposition of Ir and IrO2 from Ir (acac) 3
Patwardhan et al. Atomic layer deposition nucleation on isolated self-assembled monolayer functional groups: a combined DFT and experimental study
Lee et al. Thermal annealing of molecular layer-deposited indicone toward area-selective atomic layer deposition