Bursill et al., 1979 - Google Patents
A goniometer for electron microscopy at 1.6 Å point-to-point resolutionBursill et al., 1979
- Document ID
- 14455914374615255957
- Author
- Bursill L
- Spargo A
- Wentworth D
- Wood G
- Publication year
- Publication venue
- Journal of Applied Crystallography
External Links
Snippet
The design, operating principles and constructional details of a goniometer for use in ultra- high-resolution objective-lens pole-pieces are described. Image-matching of experimental and computer-simulated high-resolution electron micrographs is used to demonstrate an …
- 238000001493 electron microscopy 0 title description 7
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/153—Electron-optical or ion-optical arrangements for the correction of image defects, e.g. stigmators
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B21/00—Microscopes
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