[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Wakayama et al., 2003 - Google Patents

Study on the dual frequency capacitively coupled plasmas by the particle-in-cell/Monte Carlo method

Wakayama et al., 2003

Document ID
1438772790779296386
Author
Wakayama G
Nanbu K
Publication year
Publication venue
IEEE transactions on plasma science

External Links

Snippet

The dynamic structure of dual frequency (2/60 MHz) capacitively coupled plasmas (CCPs) in Ar (25 mtorr) are examined using the self-consistent particle-in-cell/Monte Carlo (PIC/MC) simulation. At first, the dependence of the discharge structure on wafer biasing conditions …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes, e.g. for surface treatment of objects such as coating, plating, etching, sterilising or bringing about chemical reactions
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/32091Radio frequency generated discharge the radio frequency energy being capacitively coupled to the plasma
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes, e.g. for surface treatment of objects such as coating, plating, etching, sterilising or bringing about chemical reactions
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/32137Radio frequency generated discharge controlling of the discharge by modulation of energy
    • H01J37/32155Frequency modulation
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes, e.g. for surface treatment of objects such as coating, plating, etching, sterilising or bringing about chemical reactions
    • H01J37/32431Constructional details of the reactor
    • H01J37/32623Mechanical discharge control means
    • H01J37/32633Baffles
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes, e.g. for surface treatment of objects such as coating, plating, etching, sterilising or bringing about chemical reactions
    • H01J37/32431Constructional details of the reactor
    • H01J37/32532Electrodes
    • H01J37/3255Material
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes, e.g. for surface treatment of objects such as coating, plating, etching, sterilising or bringing about chemical reactions
    • H01J37/32431Constructional details of the reactor
    • H01J37/3244Gas supply means
    • H01J37/32449Gas control, e.g. control of the gas flow
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes, e.g. for surface treatment of objects such as coating, plating, etching, sterilising or bringing about chemical reactions
    • H01J37/32431Constructional details of the reactor
    • H01J37/32458Vessel
    • H01J37/32522Temperature
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes, e.g. for surface treatment of objects such as coating, plating, etching, sterilising or bringing about chemical reactions
    • H01J37/32431Constructional details of the reactor
    • H01J37/3266Magnetic control means
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes, e.g. for surface treatment of objects such as coating, plating, etching, sterilising or bringing about chemical reactions
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32192Microwave generated discharge
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes, e.g. for surface treatment of objects such as coating, plating, etching, sterilising or bringing about chemical reactions
    • H01J37/32431Constructional details of the reactor
    • H01J37/32697Electrostatic control
    • H01J37/32706Polarising the substrate
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes, e.g. for surface treatment of objects such as coating, plating, etching, sterilising or bringing about chemical reactions
    • H01J37/32917Plasma diagnostics
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes

Similar Documents

Publication Publication Date Title
Wakayama et al. Study on the dual frequency capacitively coupled plasmas by the particle-in-cell/Monte Carlo method
Ventzek et al. Two‐dimensional modeling of high plasma density inductively coupled sources for materials processing
Kawamura et al. Ion energy distributions in rf sheaths; review, analysis and simulation
Lee et al. Simulation of capacitively coupled single-and dual-frequency RF discharges
Bi et al. A brief review of dual-frequency capacitively coupled discharges
Economou Tailored ion energy distributions on plasma electrodes
Panagopoulos et al. Three-dimensional simulation of an inductively coupled plasma reactor
Economou Hybrid simulation of low temperature plasmas: A brief tutorial
Wang et al. Effects of structured electrodes on electron power absorption and plasma uniformity in capacitive RF discharges
Wu et al. The effects of match circuit on the breakdown process of capacitively coupled plasma driven by radio frequency
Bera et al. Effects of reactor pressure on two-dimensional radio-frequency methane plasma: a numerical study
Becker et al. Ion energy distributions in SF6 plasmas at a radio‐frequency powered electrode
Takekida et al. Particle modelling of inductively-coupled argon plasmas with wafer biasing
Goedheer et al. Frequency effects in capacitively coupled radio-frequency glow discharges: A comparison between a 2-D fluid model and experiments
JP2895456B2 (en) Low pressure high frequency discharge plasma analyzer
Chutov et al. Dusty radio frequency discharges in argon
Makabe Radio-frequency plasma modeling for low-temperature processing
Zhang et al. Benchmarking and validation of a hybrid model for electropositive and electronegative capacitively coupled plasmas
Wen et al. Field reversal in low pressure, unmagnetized radio frequency capacitively coupled argon plasma discharges
Sun et al. Resonant electron confinement and sheath expansion heating in magnetized capacitive oxygen discharges
Kim et al. Simulation based plasma reactor design for improved ion bombardment uniformity
Wakayama et al. Velocity Distribution of Ions Incident on a Wafer in Two Frequency Capacitively‐Coupled Plasma
Takekida et al. Self-consistent particle modeling of inductively coupled CF/sub 4/discharges and radical flow
Vender Numerical studies of the low pressure RF plasma
Gupta et al. Numerical and analytic techniques to study capacitive RF discharges