Jákl et al., 2007 - Google Patents
Axial optical trap stiffness influenced by retro-reflected beamJákl et al., 2007
View PDF- Document ID
- 14239573668288998962
- Author
- Jákl P
- Šerý M
- Ježek J
- Liška M
- Zemánek P
- Publication year
- Publication venue
- Journal of Optics A: Pure and Applied Optics
External Links
Snippet
We studied experimentally how the beam retro-reflected from a planar interface (microscope slide) influences the axial stiffness of a single beam trap. Since the incident and retro- reflected beams interfere, weak intensity maxima and minima form a standing wave …
- 230000003287 optical 0 title description 38
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
- G01N2021/653—Coherent methods [CARS]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Electro-optical investigation, e.g. flow cytometers
- G01N15/1456—Electro-optical investigation, e.g. flow cytometers without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals
- G01N15/1459—Electro-optical investigation, e.g. flow cytometers without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals the analysis being performed on a sample stream
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B21/00—Microscopes
- G02B21/32—Micromanipulators structurally combined with microscopes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B21/00—Microscopes
- G02B21/16—Microscopes adapted for ultra-violet illumination; Fluorescence microscopes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B6/00—Light guides
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B26/00—Optical devices or arrangements using movable or deformable optical elements for controlling the intensity, colour, phase, polarisation or direction of light, e.g. switching, gating, modulating
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B27/00—Other optical systems; Other optical apparatus
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B5/00—Optical elements other than lenses
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Chen et al. | Superoscillation: from physics to optical applications | |
| Dienerowitz et al. | Optical manipulation of nanoparticles: a review | |
| EP2442316B1 (en) | Method and apparatus for measuring the optical forces acting on a particle | |
| Keen et al. | Comparison of a high-speed camera and a quadrant detector for measuring displacements in optical tweezers | |
| Rohrbach et al. | Trapping and tracking a local probe with a photonic force microscope | |
| Volpe et al. | Surface plasmon radiation forces | |
| Jákl et al. | Axial optical trap stiffness influenced by retro-reflected beam | |
| Wang et al. | Divided-aperture differential confocal fast-imaging microscopy | |
| Li et al. | Structured-light displacement detection method using split-waveplate for dual-beam optical tweezers | |
| US12098991B2 (en) | Method and apparatus for detecting nanoparticles and biological molecules | |
| Shipley et al. | Back-scattered detection yields viable signals in many conditions | |
| Rohrbach et al. | Photonic force microscopy: simulation of principles and applications | |
| TW200902934A (en) | Automated process control using optical metrology with a photonic nanojet | |
| Michihata et al. | Microdisplacement sensor using an optically trapped microprobe based on the interference scale | |
| Ribeiro et al. | Polymeric optical fiber tweezers as a tool for single cell micro manipulation and sensing | |
| JPH09304266A (en) | Method for holding fine particles by light radiation pressure and displacement measuring method | |
| Baek et al. | Trap stiffness in optical tweezers | |
| Chang et al. | Optimization of probe-laser focal offsets for single-particle tracking | |
| Jakl et al. | How the size of a particle approaching dielectric interface influences its behavior | |
| RU2788031C1 (en) | System for optical detection and visualization of nanoobjects with subdiffraction resolution in a microchannel | |
| Jákl et al. | How the stiffness of the optical trap depends on the proximity of the dielectric interface | |
| Shi | Investigation of image characteristics in super-resolution microsphere nanoscope | |
| WO2013051932A1 (en) | Molecular manipulation apparatus and method for investigating a plurality of molecules | |
| Zaitsev et al. | Photonic jets for mid-IR focal plane arrays produced by the triangular dielectric prism | |
| Grimm | Determining arrangements of optically bound nanoparticle clusters in three dimensions in a Gaussian beam standing wave optical trap |