Lee et al., 2016 - Google Patents
A Simple panel unit‐root test with smooth breaks in the presence of a multifactor error structureLee et al., 2016
View PDF- Document ID
- 14288717246929052572
- Author
- Lee C
- Wu J
- Yang L
- Publication year
- Publication venue
- Oxford Bulletin of Economics and Statistics
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Snippet
This paper extends the cross‐sectionally augmented panel unit‐root test (CIPS) developed by Pesaran et al.(2013, Journal of Econometrics, Vol. 175, pp. 94–115) to allow for smoothing structural changes in deterministic terms modelled by a Fourier function. The …
- 238000001744 unit root test 0 title abstract description 12
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