[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Turner et al., 2021 - Google Patents

Controlled formation of stacked si quantum dots in vertical SiGe nanowires

Turner et al., 2021

View PDF
Document ID
14134982914643789073
Author
Turner E
Campbell Q
Pizarro J
Yang H
Sapkota K
Lu P
Baczewski A
Wang G
Jones K
Publication year
Publication venue
Nano Letters

External Links

Snippet

We demonstrate the ability to fabricate vertically stacked Si quantum dots (QDs) within SiGe nanowires with QD diameters down to 2 nm. These QDs are formed during high-temperature dry oxidation of Si/SiGe heterostructure pillars, during which Ge diffuses along the pillars' …
Continue reading at www.osti.gov (PDF) (other versions)

Classifications

    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies; Multistep manufacturing processes therefor
    • H01L29/12Semiconductor bodies; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/122Single quantum well structures
    • H01L29/127Quantum box structures
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/778Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies; Multistep manufacturing processes therefor
    • H01L29/06Semiconductor bodies; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions; characterised by the concentration or distribution of impurities within semiconductor regions
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANO-TECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE OR TREATMENT OF NANO-STRUCTURES
    • B82Y10/00Nano-technology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L31/00Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/0352Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
    • H01L31/035209Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions comprising a quantum structures
    • H01L31/035227Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions comprising a quantum structures the quantum structure being quantum wires, or nano-rods
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANO-TECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE OR TREATMENT OF NANO-STRUCTURES
    • B82Y40/00Manufacture or treatment of nano-structures
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANO-TECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE OR TREATMENT OF NANO-STRUCTURES
    • B82Y30/00Nano-technology for materials or surface science, e.g. nano-composites

Similar Documents

Publication Publication Date Title
Radamson et al. State of the art and future perspectives in advanced CMOS technology
Colli et al. Ion beam doping of silicon nanowires
Shalev et al. Guided CdSe nanowires parallelly integrated into fast visible-range photodetectors
Kim et al. Influence of nanowire density on the shape and optical properties of ternary InGaAs nanowires
Vukajlovic-Plestina et al. Engineering the size distributions of ordered GaAs nanowires on silicon
Christesen et al. Encoding abrupt and uniform dopant profiles in vapor–liquid–solid nanowires by suppressing the reservoir effect of the liquid catalyst
Shin et al. Wafer-Scale Production of Uniform InAs y P1–y Nanowire Array on Silicon for Heterogeneous Integration
Christesen et al. Chemically engraving semiconductor nanowires: Using three-dimensional nanoscale morphology to encode functionality from the bottom up
Fukata et al. Clear experimental demonstration of hole gas accumulation in Ge/Si core–shell nanowires
Durmaz et al. SiGe nanomembrane quantum-well infrared photodetectors
Pielić et al. Electronic structure of quasi-freestanding WS2/MoS2 heterostructures
Dillen et al. Coherently Strained Si–Si x Ge1–x Core–Shell Nanowire Heterostructures
Knutsson et al. Atomic scale surface structure and morphology of InAs nanowire crystal superlattices: the effect of epitaxial overgrowth
Ben-Zvi et al. In-plane nanowires with arbitrary shapes on amorphous substrates by artificial epitaxy
Jurczak et al. Ten-fold enhancement of InAs nanowire photoluminescence emission with an InP passivation layer
Timm et al. Current–voltage characterization of individual as-grown nanowires using a scanning tunneling microscope
Goransson et al. Measurements of strain and bandgap of coherently epitaxially grown wurtzite InAsP–InP core–shell nanowires
Šuran Brunelli et al. Horizontal heterojunction integration via template-Assisted selective epitaxy
Zhang et al. Controlling catalyst-free formation and hole gas accumulation by fabricating Si/Ge Core–Shell and Si/Ge/Si Core− Double shell nanowires
Alekseev et al. Control of conductivity of in x Ga1–x as nanowires by applied tension and surface states
Lee et al. Measurement of exciton and trion energies in multistacked hBN/WS2 coupled quantum wells for resonant tunneling diodes
Turner et al. Controlled formation of stacked si quantum dots in vertical SiGe nanowires
Knutsson et al. Electronic structure changes due to crystal phase switching at the atomic scale limit
Hilska et al. Nanohole etching in AlGaSb with gallium droplets
Shao et al. Multimodal nanoscopic study of atomic diffusion and related localized optoelectronic response of WS2/MoS2 lateral heterojunctions