Kooser et al., 2020 - Google Patents
Gas-phase endstation of electron, ion and coincidence spectroscopies for diluted samples at the FinEstBeAMS beamline of the MAX IV 1.5 GeV storage ringKooser et al., 2020
View HTML- Document ID
- 13884015528665630659
- Author
- Kooser K
- Kivimäki A
- Turunen P
- Pärna R
- Reisberg L
- Kirm M
- Valden M
- Huttula M
- Kukk E
- Publication year
- Publication venue
- Journal of synchrotron radiation
External Links
Snippet
Since spring 2019 an experimental setup consisting of an electron spectrometer and an ion time-of-flight mass spectrometer for diluted samples has been available for users at the FinEstBeAMS beamline of the MAX IV Laboratory in Lund, Sweden. The setup enables …
- 150000002500 ions 0 title abstract description 101
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/025—Detectors specially adapted to particle spectrometers
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes, e.g. for surface treatment of objects such as coating, plating, etching, sterilising or bringing about chemical reactions
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating the ionisation of gases; by investigating electric discharges, e.g. emission of cathode
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Kooser et al. | Gas-phase endstation of electron, ion and coincidence spectroscopies for diluted samples at the FinEstBeAMS beamline of the MAX IV 1.5 GeV storage ring | |
Tang et al. | A secondary ion time-of-flight mass spectrometer with an ion mirror | |
Kolhinen et al. | JYFLTRAP: a cylindrical Penning trap for isobaric beam purification at IGISOL | |
Lassettre et al. | High‐resolution study of electron‐impact spectra at kinetic energies between 33 and 100 eV and scattering angles to 16° | |
Taylor | Resolution and sensitivity considerations of an Auger electron spectrometer based on display LEED optics | |
Kobrin et al. | Detector for measuring energy‐and angle‐resolved neutral‐particle (EARN) distributions for material desorbed from bombarded surfaces | |
Rinn et al. | Measurements of charge transfer in H+-He+ collisions | |
Charpak et al. | First beam test results with Micromegas, a high-rate, high-resolution detector | |
Garibaldi et al. | High-resolution hypernuclear spectroscopy at Jefferson Lab, Hall A | |
Wang et al. | Dissociation of multiply ionized alkanes from methane to n-butane due to electron impact | |
Weissman et al. | Conversion of 92MeV/u 38Ca/37K projectile fragments into thermalized ion beams | |
Knauer et al. | A multi-reflection time-of-flight setup for the improvement and development of new methods and the study of atomic clusters | |
JP6792334B2 (en) | Mass spectrometer with improved magnetic sectors | |
Hanstorp | An ion beam apparatus for collinear photodetachment experiments | |
Assamagan et al. | Time-zero fission-fragment detector based on low-pressure multiwire proportional chambers | |
Davids et al. | Initial operation of the recoil mass spectrometer EMMA at the ISAC-II facility of TRIUMF | |
Barna et al. | PISA–an experiment for fragment spectroscopy at the Internal Beam of COSY: application of an Axial Ionization Chamber | |
Akers et al. | Construction and performance test of prototype parallel plate avalanche counters at RAON | |
Hvelplund et al. | Equilibrium charge distributions of light ions in helium, measured with a position-sensitive open electron multiplier | |
Tam et al. | Excitation of optically forbidden transitions in argon and neon by electron impact | |
CN112259440B (en) | Ionization mass spectrometry device and method in vacuum ultraviolet light | |
Morozov et al. | Simultaneous energy distribution and ion fraction measurements using a linear time-of-flight analyzer with a floatable drift tube | |
Boris et al. | Deuterium anions in inertial electrostatic confinement devices | |
Mann et al. | Cusp-electrons used for velocity measurements of heavy ion projectiles | |
Gersh et al. | Application of molecular‐beam techniques to the study of neutral particles in thermal plasmas |