[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Appelhans et al., 2016 - Google Patents

High efficiency noble gas electron impact ion source for isotope separation

Appelhans et al., 2016

View PDF
Document ID
13367274938872479713
Author
Appelhans A
Olson J
Dahl D
Ward M
Publication year

External Links

Snippet

An electron impact ion source has been designed for generation of noble gas ions in a compact isotope separator. The source utilizes a circular filament that surrounds an ionization chamber, enabling multiple passes of electrons through the ionization chamber …
Continue reading at www.osti.gov (PDF) (other versions)

Classifications

    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/08Ion sources; Ion guns
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/12Ion sources; Ion guns using an arc discharge, e.g. of the duoplasmatron type
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/28Static spectrometers
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/02Details
    • H01J49/06Electron- or ion-optical arrangements
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/02Details
    • H01J49/025Detectors specially adapted to particle spectrometers
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/02Details
    • H01J49/022Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/06Sources
    • H01J2237/08Ion sources
    • H01J2237/0802Field ionization sources
    • H01J2237/0807Gas field ion sources [GFIS]
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/02Details
    • H01J49/22Electrostatic deflection
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J27/00Ion beam tubes
    • H01J27/02Ion sources; Ion guns
    • H01J27/028Negative ion sources
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/004Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J41/00Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas; Discharge tubes for evacuation by diffusion of ions
    • H01J41/02Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas
    • H01J41/06Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas with ionisation by means of cold cathodes
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J47/00Tubes for determining the presence, intensity, density or energy of radiation or particles

Similar Documents

Publication Publication Date Title
Reynolds High sensitivity mass spectrometer for noble gas analysis
Menzinger et al. High intensity, low energy spread ion source for chemical accelerators
Kirchner et al. Investigation of gaseous discharge ion sources for isotope separation on-line
US6815666B2 (en) Single stage accelerator mass spectrometer
US20120211651A1 (en) Mass Spectrometer and Method for Direct Measurement of Isotope Ratios
Mathur et al. Ionization of xenon by electrons: Partial cross sections for single, double, and triple ionization
US7295015B2 (en) Ionization gauge
US9472389B2 (en) Ion source assembly for static mass spectrometer
US7030619B2 (en) Ionization gauge
RU2554104C2 (en) Mass-spectrometer analyser of gas leak detector
Pikin et al. A beam line for highly charged ions
Moehs et al. Kingdon trap apparatus and technique for precise measurement of the lifetimes of metastable levels of ions
Appelhans et al. High efficiency noble gas electron impact ion source for isotope separation
Clausnitzer et al. An electron beam ion source for the production of multiply charged heavy ions
EP1725847A2 (en) An ionization gauge
US7038199B2 (en) Apparatus and method for elemental mass spectrometry
CN115020189A (en) Online mass spectrometry system
Rosner Production and preparation of highly charged ions for re-trapping in ultra-cold environments
Price et al. An electron spectrometer to record gas phase photoelectron-photoelectron coincidence spectra following double photoionization
Harvey et al. A coincidence time-of-flight mass spectrometer
Barnfield et al. A 100 keV heavy ion accelerator for the study of irradiation damage
RU137653U1 (en) MASS SPECTROMETRIC ANALYZER OF GAS LEAK DETECTOR
RU81442U1 (en) DEVICE FOR CALIBRATING A MASS SPECTROMETER
Gruebler et al. Source of polarized ions for a tandem accelerator
CN116206943A (en) Mass spectrometer and gas phase ion source device thereof