Gao et al., 1987 - Google Patents
Atomic structures of epitaxial overlayers of bcc Fe on fcc Rh surfacesGao et al., 1987
- Document ID
- 13363148978790673229
- Author
- Gao Q
- Tsong T
- Publication year
- Publication venue
- Surface Science Letters
External Links
Snippet
Atomic structures of epitaxial overlayers of bcc Fe on fcc Rh (111),(001), and (102) planes have been directly observed in the field ion microscope with use of nanosecond pulsed- laser heating of the surface. The conditions of epitaxial growth of superlattice layers, both …
- 230000012010 growth 0 abstract description 21
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02538—Group 13/15 materials
- H01L21/02546—Arsenides
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer, carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer, carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL-GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B23/00—Single-crystal growth by condensing evaporated or sublimed material
- C30B23/02—Epitaxial-layer growth
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Smith et al. | Characterization of structural defects in wurtzite GaN grown on 6H SiC using plasma‐enhanced molecular beam epitaxy | |
Jiang et al. | Atomic‐force‐microscopic study of heteroepitaxial diamond nucleation on (100) silicon | |
CN103534786A (en) | Oxide removal from semiconductor surfaces | |
US8389995B2 (en) | Epitaxial solid-state semiconducting heterostructures and method for making same | |
Gao et al. | Atomic structures of epitaxial overlayers of bcc Fe on fcc Rh surfaces | |
Yamaguchi et al. | Growth of GaAs/ErAs/GaAs structures by migration‐enhanced epitaxy | |
Malikov et al. | Observation of the Stranski-Krastanow mechanism during the ultrathin Mo film growth on the sapphire R-plane | |
US5132247A (en) | Quantum effective device and process for its production | |
US6383286B1 (en) | Method of making semiconductor super-atom and aggregate thereof | |
Tatsuyama et al. | Effect of the growth temperature on the RHEED pattern of thin Ge layers on Si (001)− 2× 1 surface | |
US5134091A (en) | Quantum effective device and process for its production | |
Yapsir et al. | Structural Effects in Al (111)/Si (111) Heteroepitaxy by Partially Ionized Beam Deposition α | |
Tanaka et al. | Multi-chamber ultrahigh vacuum scanning tunneling microscope system for investigating processed GaAs surfaces and observation of argon-ion-bombarded GaAs surfaces | |
Oral et al. | Initial stages of SiGe epitaxy on Si (001) studied by scanning tunneling microscopy | |
Ueda | Film growth of metals and semiconductors with ionized beams and surface imperfections | |
Monteverde et al. | On the growth of Fe2As grains at the interface of the Fe/AlxGa1− xAs (x= 0.25) system | |
Jing et al. | Epitaxial growth of ultrathin films of bismuth: an atomic force microscopy study | |
Yun et al. | Low‐temperature epitaxial growth of GaAs on on‐axis (100) Si using ionized source beam epitaxy | |
Vögeli | STM study of Si-Ge heterostructures grown by magnetron sputter epitaxy | |
Shinohara et al. | ICB deposition and epitaxial growth of GaAs thin films | |
Ishiwatari et al. | Growth of crystalline silicon films on polycrystalline substrate | |
Yun et al. | Effect of ionization and acceleration of As-source beam on low-temperature epitaxial growth of GaAs on exact (100) Si | |
Lowes et al. | Strained layer epitaxy on rough Si surfaces | |
JPH01161822A (en) | Element and manufacture thereof | |
Löher et al. | Van Der Waals Epitaxy of II-Vi Semiconductors on Layered Chalcogenide (0001) Substrates: Towards Buffer Layers for Lattice Mismatched Systems? |