[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Sian, 2020 - Google Patents

Low SEY Surfaces for future particle accelerators

Sian, 2020

Document ID
13210481944202642928
Author
Sian B
Publication year
Publication venue
PQDT-Global

External Links

Snippet

Abstract Beam Induced Electron Multipacting (BIEM) and the Electron cloud (e-cloud) are a severe problem for many existing and future high intensity charged particle accelerators, such as the LHC, KEKB, ILC, CLIC, RHIC, and FCC. Secondary electrons play a key role in …
Continue reading at search.proquest.com (other versions)

Classifications

    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/06Sources
    • H01J2237/08Ion sources
    • H01J2237/0802Field ionization sources
    • H01J2237/0807Gas field ion sources [GFIS]
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/305Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating or etching
    • H01J37/3053Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating or etching for evaporating or etching
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes, e.g. for surface treatment of objects such as coating, plating, etching, sterilising or bringing about chemical reactions
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/30Electron or ion beam tubes for processing objects
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/48Ion implantation

Similar Documents

Publication Publication Date Title
Renk et al. Materials modification using intense ion beams
Soh et al. Shadowgraphic studies of DLC film deposition process in dense plasma focus device
Zeb et al. Deposition of diamond-like carbon film using dense plasma focus
Ahmad et al. Study of lateral spread of ions emitted from 2.3 kJ plasma focus with hydrogen and nitrogen gases
Sian Low SEY Surfaces for future particle accelerators
Yin Vallgren Low secondary electron yield carbon coatings for electron cloud mitigation in modern particle accelerators
Scheer et al. High negative ion yield from light molecule scattering
Lebedev et al. Calculation of the lifetimes of thin stripper targets under bombardment of intense pulsed ions
Wang Secondary electron yield measurements of anti-multipacting surfaces for accelerators
Torrisi et al. An unconventional ion implantation method for producing Au and Si nanostructures using intense laser-generated plasmas
Das et al. Carbon coatings for fusion applications
Láska et al. Laser induced direct implantation of ions
Lorkiewicz et al. Coating in ultra-high vacuum cathodic-arc and processing of Pb films on Nb substrate as steps in preparation of Nb-Pb photocathodes for radio-frequency, superconducting e− guns
Ayrapetov et al. Stand for coating deposition and coating/materials testing
Zameroski et al. Secondary electron yield measurements from materials with application to collectors of high-power microwave devices
Woller Characterization of the dynamic formation of nano-tendril surface morphology on tungsten while exposed to helium plasma
Malyshev Non-evaporable getter (NEG)-coated vacuum chamber
Baglin et al. Beam-Induced Electron Multipacting, Electron Cloud, and Vacuum Design
Tatarintsev et al. Electrizaton and cathodoluminescence of single crystal MgO under 2.5–15 keV electron beam
Kaminsky Surface effects in controlled thermonuclear fusion
Cimino Interaction between beams and vacuum system walls
JP2015149279A (en) Plasma source, ion source and method of ion generation
Bilgen Dynamic pressure in particle accelerators: experimental measurements and simulation for the LHC
Shahriari et al. Investigation of spatial distribution of hydrogen and argon ions and effects of them on aluminum samples in a 2.5 kJ mater type plasma focus device
Sasao et al. Plasma Electrode for Cesium-Free Negative Hydrogen Ion Sources