Beni et al., 1984 - Google Patents
High-precision robot system for inspection and testing of electronic devicesBeni et al., 1984
- Document ID
- 13173890652171704010
- Author
- Beni G
- Hackwood S
- Trimmer W
- Publication year
- Publication venue
- Proceedings. 1984 IEEE International Conference on Robotics and Automation
External Links
Snippet
We describe a feasibility demonstration of an'intelligent'robot system for inspection and testing of electronic properties of devices. The system consists of a Seiko RT-3000 robot, an Automatix Autovision II vision system, two CCD Panasonic cameras plus peripherals. The …
- 238000007689 inspection 0 title abstract description 12
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/30—Nc systems
- G05B2219/40—Robotics, robotics mapping to robotics vision
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM]
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