[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Mostamand et al., 2020 - Google Patents

Production of clean rare isotope beams at TRIUMF ion guide laser ion source

Mostamand et al., 2020

View PDF
Document ID
13007102256070887614
Author
Mostamand M
Li R
Romans J
Ames F
Kunz P
Mjϕs A
Lassen J
Publication year
Publication venue
Hyperfine Interactions

External Links

Snippet

Hot cavity resonant ionization laser ion sources (RILIS) provide a multitude of radioactive ion beams with high ionization efficiency and element selective ionization. However, in hot cavity RILIS there still remains isobaric contamination in the extracted beam from surface …
Continue reading at arxiv.org (PDF) (other versions)

Classifications

    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/42Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205Device types
    • H01J49/422Two-dimensional RF ion traps
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/08Ion sources; Ion guns
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J27/00Ion beam tubes
    • H01J27/02Ion sources; Ion guns
    • H01J27/16Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation
    • H01J27/18Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation with an applied axial magnetic field
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/02Details
    • H01J49/06Electron- or ion-optical arrangements
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/06Sources
    • H01J2237/08Ion sources
    • H01J2237/0802Field ionization sources
    • H01J2237/0807Gas field ion sources [GFIS]
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/02Details
    • H01J49/022Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/28Static spectrometers
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes, e.g. for surface treatment of objects such as coating, plating, etching, sterilising or bringing about chemical reactions
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/30Electron or ion beam tubes for processing objects

Similar Documents

Publication Publication Date Title
Bacal et al. Negative hydrogen ion production mechanisms
Kester et al. Accelerated radioactive beams from REX-ISOLDE
Wutte et al. Emittance measurements for high charge state ion beams extracted from the AECR-U ion source
Mostamand et al. Production of clean rare isotope beams at TRIUMF ion guide laser ion source
Bricault et al. An overview on TRIUMF’s developments on ion source for radioactive beams
Lamy et al. Status of charge breeding with electron cyclotron resonance ion sources
Limbach et al. An electrostatic ion guide for efficient transmission of low energy externally formed ions into a Fourier transform ion cyclotron resonance mass spectrometer
Dudnikov et al. Cesiation in highly efficient surface plasma sources
Holmes Negative hydrogen ion beams
Kumar et al. ECR ion source based low energy ion beam facility
Lavoie et al. A test stand for off-line laser ion source development at TRIUMF
Davydenko et al. Optimization of an ion-optics system with “thick” electrodes for the diagnostic neutral beam injector of the TEXTOR tokamak
Abdelrahman Factors enhancing production of multicharged ion sources and their applications
Biri et al. The new ECR ion source of the ATOMKI: A tool to generate highly charged heavy ion plasma and beam
Scrivens Classification of ion sources
Lamy et al. ECRIS charge breeding: High resolution spectra and emittance
Bollen Radioactive ion beams and Penning traps
Gobin et al. Two approaches for H− ion production with 2.45 GHz ion sources
Dougar-Jabon Production of hydrogen and deuterium negative ions in an electron cyclotron resonance driven plasma
Meyer ECR-based atomic collision physics research at ORNL MIRF
Vogel Atomic physics with ECR ion source in Uppsala
Tanaka et al. 2.45 GHz ECR ion source and expected performance for polarized heavy ion source
Horst Laser Spectroscopy of ²⁰⁸Bi⁸²⁺ and Commissioning of the HITRAP Cooling Trap
Hobein et al. Optimization of the Stockholm R-EBIT for production and extraction of highly charged ions
Novikov et al. Exotic nuclides at the reactor pik: pitrap project