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Iwamoto et al., 2020 - Google Patents

Measurement of defect-induced electrical resistivity change of tungsten wire at cryogenic temperature using high-energy proton irradiation

Iwamoto et al., 2020

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Document ID
12815618138716580989
Author
Iwamoto Y
Yoshida M
Matsuda H
Meigo S
Satoh D
Yashima H
Yabuuchi A
Kinomura A
Shima T
Publication year
Publication venue
Proceedings of the 14th International Workshop on Spallation Materials Technology

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Snippet

For validation of the number of displacements per atom (DPA) of tungsten, we measured the defect-induced electrical resistivity change of the wire sample of tungsten related to the displacement cross section under irradiation with 389-MeV protons at 10 K. The Gifford …
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