Fadley, 2008 - Google Patents
Atomic‐level characterization of materials with core‐and valence‐level photoemission: basic phenomena and future directionsFadley, 2008
View PDF- Document ID
- 12640956892063292419
- Author
- Fadley C
- Publication year
- Publication venue
- Surface and Interface Analysis: An International Journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films
External Links
Snippet
In this overview, the basic concepts of core and valence photoelectron spectroscopy (photoemission), photoelectron diffraction, and photoelectron holography are introduced. Then some current developments in these techniques that should enhance their utility for …
- 239000000463 material 0 title abstract description 31
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by the preceding groups
- G01N33/48—Investigating or analysing materials by specific methods not covered by the preceding groups biological material, e.g. blood, urine; Haemocytometers
- G01N33/50—Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Fadley | X-ray photoelectron spectroscopy: Progress and perspectives | |
| Fadley | Atomic‐level characterization of materials with core‐and valence‐level photoemission: basic phenomena and future directions | |
| Fadley | X-ray photoelectron spectroscopy: From origins to future directions | |
| Kalha et al. | Hard x-ray photoelectron spectroscopy: a snapshot of the state-of-the-art in 2020 | |
| Gao et al. | Core-level spectroscopy calculation and the plane wave pseudopotential method | |
| Rotenberg et al. | Indium 7× 3 on Si (111): a nearly free electron metal in two dimensions | |
| Fadley et al. | Diffraction and holography with photoelectrons and fluorescent X-rays | |
| Kobayashi et al. | Development of a laboratory system hard X-ray photoelectron spectroscopy and its applications | |
| Baer et al. | Characterization of thin films and coatings | |
| Gray | Future directions in standing-wave photoemission | |
| King et al. | Angle, spin, and depth resolved photoelectron spectroscopy on quantum materials | |
| Takubo et al. | Bond order and the role of ligand states in stripe-modulated IrTe 2 | |
| Elnaggar et al. | Magnetic contrast at spin-flip excitations: an advanced X-ray spectroscopy tool to study magnetic-ordering | |
| Zegenhagen | X-ray standing waves technique: Fourier imaging active sites | |
| Lin et al. | Observation of intercalation-driven zone folding in quasi-free-standing graphene energy bands | |
| Fairchild et al. | Photoemission spectroscopy using virtual photons emitted by positron sticking: a complementary probe for top-layer surface electronic structures | |
| Conlon et al. | Hard x-ray standing-wave photoemission insights into the structure of an epitaxial Fe/MgO multilayer magnetic tunnel junction | |
| Drube | Photoelectron spectroscopy with hard X-rays | |
| Fadley et al. | Photoelectron diffraction: space, time, and spin dependence of surface structures | |
| Eiteneer et al. | Depth-Resolved Composition and Electronic Structure of Buried Layers and Interfaces in a LaNiO3/SrTiO3 Superlattice from Soft-and Hard-X-ray Standing-Wave Angle-Resolved Photoemission | |
| Vattuone et al. | High resolution electron energy loss spectroscopy (HREELS): a sensitive and versatile surface tool | |
| Nemšák et al. | Standing-Wave and Resonant Soft-and Hard-X-ray Photoelectron Spectroscopy of Oxide Interfaces | |
| Fadley et al. | Surface, interface, and nanostructure characterization with photoelectron diffraction and photoelectron and X-ray holography | |
| Flavell | Spiers Memorial Lecture: prospects for photoelectron spectroscopy | |
| Dai | Ultrafast photoemission electron microscopy: A multidimensional probe of nonequilibrium physics |