[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Li et al., 2023 - Google Patents

Fast polarization-sensitive second-harmonic generation microscopy based on off-axis interferometry

Li et al., 2023

View HTML @Full View
Document ID
12423742309024283304
Author
Li X
Yu W
Hu R
Qu J
Liu L
Publication year
Publication venue
Optics Express

External Links

Snippet

We propose polarization-sensitive second-harmonic generation microscopy based on off- axis interferometry (OI-PSHG) by recording the complex field of a wide-field second- harmonic generation (SHG) image and performing polarization measurements. With the …
Continue reading at opg.optica.org (HTML) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering
    • G01N2021/653—Coherent methods [CARS]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/636—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/23—Bi-refringence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/10—Condensers affording dark-field illumination
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G—PHYSICS
    • G02—OPTICS
    • G02F—DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics
    • G02F1/35—Non-linear optics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by the preceding groups

Similar Documents

Publication Publication Date Title
Beaurepaire et al. Full-field optical coherence microscopy
Yu et al. Wavelength-scanning digital interference holography for tomographic three-dimensional imaging by use of the angular spectrum method
Ramaz et al. Photorefractive detection of tagged photons in ultrasound modulated optical tomography of thick biological tissues
Park et al. Speckle-field digital holographic microscopy
Field et al. Superresolved multiphoton microscopy with spatial frequency-modulated imaging
Lacot et al. Laser optical feedback tomography
Leveque et al. Ultrasonic tagging of photon paths in scattering media:? parallel speckle modulation processing
Hu et al. Harmonic optical tomography of nonlinear structures
Saba et al. Polarization-sensitive optical diffraction tomography
Sawatari Optical heterodyne scanning microscope
Aknoun et al. Quantitative retardance imaging of biological samples using quadriwave lateral shearing interferometry
Amat-Roldan et al. Fast image analysis in polarization SHG microscopy.
Winters et al. Measurement of orientation and susceptibility ratios using a polarization-resolved second-harmonic generation holographic microscope
Teulon et al. Theoretical, numerical and experimental study of geometrical parameters that affect anisotropy measurements in polarization-resolved SHG microscopy
Shaffer et al. Label-free second-harmonic phase imaging of biological specimen by digital holographic microscopy
Reiser et al. Three-dimensional geometry of collagenous tissues by second harmonic polarimetry
Rivard et al. Imaging the bipolarity of myosin filaments with Interferometric Second Harmonic Generation microscopy
Jones et al. Direct-to-video holographic readout in quantum wells for three-dimensional imaging through turbid media
Bancelin et al. Fast interferometric second harmonic generation microscopy
US8334976B2 (en) Second-order nonlinear susceptibility of a nanoparticle using coherent confocal microscopy
Lopera et al. Linear diattenuation imaging of biological samples with digital lensless holographic microscopy
Sun et al. Multiphoton polarization imaging of the stratum corneum and the dermis in ex-vivo human skin
Schön et al. Polarization distortion effects in polarimetric two-photon microscopy
Chen et al. Dual-LC PSHG microscopy for imaging collagen type I and type II gels with pixel-resolution analysis
Heuke et al. Coherent anti-stokes raman fourier ptychography