Evans et al., 1994 - Google Patents
Methods of measuring oxidation growth stressesEvans et al., 1994
- Document ID
- 12270209811100582282
- Author
- Evans H
- Huntz A
- Publication year
- Publication venue
- Materials at high temperatures
External Links
Snippet
Stresses developed isothermally at temperature in both the oxide layer and metal substrate as a consequence of the oxidation process are known as 'growth stresses'. They seem to be an indigenous feature of all oxidation systems and, consequently, offer a potential threat to …
- 230000035882 stress 0 title abstract description 99
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating magnetic variables
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/02—Details
- G01N3/06—Special adaptations of indicating or recording means
- G01N3/066—Special adaptations of indicating or recording means with electrical indicating or recording means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Guerain et al. | Review of stress fields in Zirconium alloys corrosion scales | |
| Wright et al. | Residual stresses in convoluted oxide scales | |
| Underwood et al. | Measurement of microscopic plastic-strain distributions in the region of a crack tip: Optical interference and moiré grid interference are used to measure plastic strains around a crack | |
| Calvarin et al. | Oxide scale stress determination by Raman spectroscopy application to the NiCr/Cr2O3 system and influence of yttrium | |
| Evans et al. | Methods of measuring oxidation growth stresses | |
| Kurpaska | Structural properties of zirconia–in-situ high temperature XRD characterization | |
| Jalali et al. | High throughput determination of creep parameters using cantilever bending: part i-steady-state | |
| Volpe et al. | Replicating PWR primary water conditions in low pressure H2-steam environment to study alloy 600 oxidation processes | |
| Wang et al. | Mapping of the residual stress distribution in a brazed zirconia-iron joint | |
| Ogata et al. | Interdiffusion in uranium-zirconium solid solutions | |
| Goedjen et al. | Evaluation of stresses in Ni NiO and Cr Cr2O3 during high temperature oxidation by in situ X-ray diffraction | |
| Hou et al. | Growth strains and stress relaxation in alumina scales during high temperature oxidation | |
| Bongiorno et al. | Influence of surface finishing on high-temperature oxidation of AISI type 444 ferritic stainless steel used in SOFC stacks | |
| Tortorelli et al. | Growth stress–microstructure relationships for alumina scales | |
| Hou et al. | Growth strains in thermally grown Al 2 O 3 scales studied using synchrotron radiation | |
| Wang et al. | Influence of residual stress on thermal expansion behavior | |
| Hurst et al. | The determination of fracture strains of growing surface oxides on mild steel at high temperatures | |
| Loh et al. | Residual stress profiles of plasma nitrided steels | |
| Li et al. | Determination of oxide growth stress by a novel deflection method | |
| Wilde | Technique for Studying the Kinetics of Intergranular Crack Nucleation on AISI Type 304 Stainless Steel in Oxygenated Water at 289 C | |
| Renusch et al. | Effect of edges and corners on stresses in thermally grown alumina scales | |
| Rahman et al. | Nanomechanical and nanoscratch behavior of oxides formed on inconel 617 at 950° C | |
| Zhou et al. | Research on the thermal expansion behavior of anodic films on aluminium | |
| Wagner et al. | The ϕ-Integral Method for X-Ray Residual Stress Measurements | |
| Gaillet et al. | Effect of NiO scales on the creep behavior of Ni single crystals at 550° C |