Barysheva et al., 2020 - Google Patents
Features of multilayer mirror application for focusing and collimating X-rays from inverse Compton scattering sourcesBarysheva et al., 2020
- Document ID
- 11661331892246341660
- Author
- Barysheva M
- Malyshev I
- Polkovnikov V
- Salashchenko N
- Svechnikov M
- Chkhalo N
- Publication year
- Publication venue
- Quantum Electronics
External Links
Snippet
We have analysed the use of X-ray interference multilayer mirrors as the elements of a focusing scheme for a compact source based on inverse Compton scattering. An algorithm is proposed for selecting mirror parameters, which takes into account the properties of the …
- 230000000737 periodic 0 abstract description 13
Classifications
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionizing radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionizing radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
- G21K1/062—Devices having a multilayer structure
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/064—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/067—Construction details
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionizing radiation, e.g. focusing or moderating
- G21K1/02—Arrangements for handling particles or ionizing radiation, e.g. focusing or moderating using diaphragms, collimators
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionizing radiation, e.g. focusing or moderating
- G21K1/10—Scattering devices; Absorbing devices; Ionising radiation filters
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K7/00—Gamma- or X-ray microscopes
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Brenner et al. | Laser-driven x-ray and neutron source development for industrial applications of plasma accelerators | |
Heimann et al. | Linac Coherent Light Source soft x-ray materials science instrument optical design and monochromator commissioning | |
Tono et al. | Beamline, experimental stations and photon beam diagnostics for the hard x-ray free electron laser of SACLA | |
Osterhoff et al. | Coherence filtering of x-ray waveguides: analytical and numerical approach | |
EP1642304B1 (en) | Beam conditioning system | |
Polikarpov et al. | X-ray harmonics rejection on third-generation synchrotron sources using compound refractive lenses | |
Vishnyakov et al. | Conception of broadband stigmatic high-resolution spectrometers for the soft X-ray range | |
Seely et al. | Enhanced x-ray resolving power achieved behind the focal circles of Cauchois spectrometers | |
Jark et al. | Optimisation of a compact optical system for the beamtransport at the x-ray fluorescence beamline at Elettra for experiments with small spots | |
Wu et al. | Spectral investigation of highly ionized bismuth plasmas produced by subnanosecond Nd: YAG laser pulses | |
Garakhin et al. | Laboratory reflectometer for the investigation of optical elements in a wavelength range of 5–50 nm: description and testing results | |
Huang et al. | Dispersive spread of virtual sources by asymmetric X-ray monochromators | |
Zan et al. | Design optimization of a periodic microstructured array anode for hard x-ray grating interferometry | |
Vishnyakov et al. | Soft X-ray flat-field VLS spectrographs | |
Artyukov et al. | Coherent scattering from tilted objects | |
Vishnyakov et al. | Imaging diffraction VLS spectrometer for a wavelength range λ> 120 Å | |
Barysheva et al. | Features of multilayer mirror application for focusing and collimating X-rays from inverse Compton scattering sources | |
Strocov | Concept of a spectrometer for resonant inelastic X-ray scattering with parallel detection in incoming and outgoing photon energies | |
Bolkhovitinov et al. | Study of VUV radiation of hybrid and standard X-pinches on KING electric discharge facility | |
Sheil et al. | Analysis of soft x-ray emission spectra of laser-produced dysprosium, erbium and thulium plasmas | |
Corso et al. | Broadband multilayer optics for ultrafast EUV absorption spectroscopy with free electron laser radiation | |
Nechay et al. | Lasing efficiency of krypton ions in the (8–14)-nm band upon pulsed laser excitation | |
Heidarian et al. | Lifetimes and oscillator strengths for ultraviolet transitions in singly-ionized germanium | |
Motoyama et al. | Two-stage reflective optical system for achromatic 10 nm x-ray focusing | |
Kimura et al. | Parabolic refractive X-ray lenses made of quartz glass for high-energy X-ray focusing |