[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Barysheva et al., 2020 - Google Patents

Features of multilayer mirror application for focusing and collimating X-rays from inverse Compton scattering sources

Barysheva et al., 2020

Document ID
11661331892246341660
Author
Barysheva M
Malyshev I
Polkovnikov V
Salashchenko N
Svechnikov M
Chkhalo N
Publication year
Publication venue
Quantum Electronics

External Links

Snippet

We have analysed the use of X-ray interference multilayer mirrors as the elements of a focusing scheme for a compact source based on inverse Compton scattering. An algorithm is proposed for selecting mirror parameters, which takes into account the properties of the …
Continue reading at iopscience.iop.org (other versions)

Classifications

    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionizing radiation, e.g. focusing or moderating
    • G21K1/06Arrangements for handling particles or ionizing radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G21K1/062Devices having a multilayer structure
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00Arrangements for handling radiation or particles
    • G21K2201/06Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/064Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00Arrangements for handling radiation or particles
    • G21K2201/06Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/062Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00Arrangements for handling radiation or particles
    • G21K2201/06Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/067Construction details
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionizing radiation, e.g. focusing or moderating
    • G21K1/02Arrangements for handling particles or ionizing radiation, e.g. focusing or moderating using diaphragms, collimators
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionizing radiation, e.g. focusing or moderating
    • G21K1/10Scattering devices; Absorbing devices; Ionising radiation filters
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K7/00Gamma- or X-ray microscopes
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays

Similar Documents

Publication Publication Date Title
Brenner et al. Laser-driven x-ray and neutron source development for industrial applications of plasma accelerators
Heimann et al. Linac Coherent Light Source soft x-ray materials science instrument optical design and monochromator commissioning
Tono et al. Beamline, experimental stations and photon beam diagnostics for the hard x-ray free electron laser of SACLA
Osterhoff et al. Coherence filtering of x-ray waveguides: analytical and numerical approach
EP1642304B1 (en) Beam conditioning system
Polikarpov et al. X-ray harmonics rejection on third-generation synchrotron sources using compound refractive lenses
Vishnyakov et al. Conception of broadband stigmatic high-resolution spectrometers for the soft X-ray range
Seely et al. Enhanced x-ray resolving power achieved behind the focal circles of Cauchois spectrometers
Jark et al. Optimisation of a compact optical system for the beamtransport at the x-ray fluorescence beamline at Elettra for experiments with small spots
Wu et al. Spectral investigation of highly ionized bismuth plasmas produced by subnanosecond Nd: YAG laser pulses
Garakhin et al. Laboratory reflectometer for the investigation of optical elements in a wavelength range of 5–50 nm: description and testing results
Huang et al. Dispersive spread of virtual sources by asymmetric X-ray monochromators
Zan et al. Design optimization of a periodic microstructured array anode for hard x-ray grating interferometry
Vishnyakov et al. Soft X-ray flat-field VLS spectrographs
Artyukov et al. Coherent scattering from tilted objects
Vishnyakov et al. Imaging diffraction VLS spectrometer for a wavelength range λ> 120 Å
Barysheva et al. Features of multilayer mirror application for focusing and collimating X-rays from inverse Compton scattering sources
Strocov Concept of a spectrometer for resonant inelastic X-ray scattering with parallel detection in incoming and outgoing photon energies
Bolkhovitinov et al. Study of VUV radiation of hybrid and standard X-pinches on KING electric discharge facility
Sheil et al. Analysis of soft x-ray emission spectra of laser-produced dysprosium, erbium and thulium plasmas
Corso et al. Broadband multilayer optics for ultrafast EUV absorption spectroscopy with free electron laser radiation
Nechay et al. Lasing efficiency of krypton ions in the (8–14)-nm band upon pulsed laser excitation
Heidarian et al. Lifetimes and oscillator strengths for ultraviolet transitions in singly-ionized germanium
Motoyama et al. Two-stage reflective optical system for achromatic 10 nm x-ray focusing
Kimura et al. Parabolic refractive X-ray lenses made of quartz glass for high-energy X-ray focusing