[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Lin et al., 2006 - Google Patents

Application of an ordinal optimization algorithm to the wafer testing process

Lin et al., 2006

View PDF
Document ID
11434703211879103911
Author
Lin S
Horng S
Publication year
Publication venue
IEEE Transactions on Systems, Man, and Cybernetics-Part A: Systems and Humans

External Links

Snippet

In this correspondence, we have formulated a stochastic optimization problem to find the optimal threshold values to reduce the overkills of dies under a tolerable retest level in wafer testing process. The problem is a hard optimization problem with a huge solution space. We …
Continue reading at ir.lib.nycu.edu.tw (PDF) (other versions)

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06QDATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTING PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTING PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q10/00Administration; Management
    • G06Q10/06Resources, workflows, human or project management, e.g. organising, planning, scheduling or allocating time, human or machine resources; Enterprise planning; Organisational models
    • G06Q10/063Operations research or analysis
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06NCOMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00Computer systems based on biological models
    • G06N3/02Computer systems based on biological models using neural network models
    • G06N3/04Architectures, e.g. interconnection topology
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06KRECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K9/00Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/62Methods or arrangements for recognition using electronic means
    • G06K9/6217Design or setup of recognition systems and techniques; Extraction of features in feature space; Clustering techniques; Blind source separation
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06NCOMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00Computer systems based on biological models
    • G06N3/02Computer systems based on biological models using neural network models
    • G06N3/08Learning methods
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06KRECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K9/00Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/62Methods or arrangements for recognition using electronic means
    • G06K9/6267Classification techniques
    • G06K9/6268Classification techniques relating to the classification paradigm, e.g. parametric or non-parametric approaches
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50Computer-aided design
    • G06F17/5068Physical circuit design, e.g. layout for integrated circuits or printed circuit boards
    • G06F17/5081Layout analysis, e.g. layout verification, design rule check
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06NCOMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00Computer systems based on biological models
    • G06N3/12Computer systems based on biological models using genetic models
    • G06N3/126Genetic algorithms, i.e. information processing using digital simulations of the genetic system
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06KRECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K9/00Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/62Methods or arrangements for recognition using electronic means
    • G06K9/6267Classification techniques
    • G06K9/6279Classification techniques relating to the number of classes
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50Computer-aided design
    • G06F17/5009Computer-aided design using simulation
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06NCOMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N99/00Subject matter not provided for in other groups of this subclass
    • G06N99/005Learning machines, i.e. computer in which a programme is changed according to experience gained by the machine itself during a complete run
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06NCOMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N5/00Computer systems utilising knowledge based models
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06NCOMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N7/00Computer systems based on specific mathematical models
    • G06N7/005Probabilistic networks

Similar Documents

Publication Publication Date Title
US7526461B2 (en) System and method for temporal data mining
US7415387B2 (en) Die and wafer failure classification system and method
Horng et al. Applying PSO and OCBA to minimize the overkills and re-probes in wafer probe testing
Yoon et al. Life-cycle maintenance cost analysis framework considering time-dependent false and missed alarms for fault diagnosis
EP3809341A1 (en) Inference verification of machine learning algorithms
Papatheocharous et al. Feature subset selection for software cost modelling and estimation
CN113962145B (en) Parameter uncertainty quantitative modeling method under interval data sample condition
Teferra et al. Mapping model validation metrics to subject matter expert scores for model adequacy assessment
Lin et al. Application of an ordinal optimization algorithm to the wafer testing process
US20210365813A1 (en) Management computer, management program, and management method
US11035666B2 (en) Inspection-guided critical site selection for critical dimension measurement
Oveisi et al. Software reliability prediction: A survey
Bilski et al. Automatic parametric fault detection in complex analog systems based on a method of minimum node selection
Rasay et al. Reinforcement learning based on stochastic dynamic programming for condition-based maintenance of deteriorating production processes
Afzal et al. Search-based prediction of fault-slip-through in large software projects
Stoyanov et al. Similarity approach for reducing qualification tests of electronic components
Fazlollahtabar et al. Adapted Markovian model to control reliability assessment in multiple AGV
JP2016520220A (en) Hidden attribute model estimation device, method and program
Papatheocharous et al. Software cost modelling and estimation using artificial neural networks enhanced by input sensitivity analysis
Gharehchopogh et al. Artificial neural networks based analysis of software cost estimation models
Yadav Software Reliability Prediction by using Deep Learning Technique
Golmohammadi et al. Neural network application for supplier selection
Horiwaki Determining Manufacturing Condition Range Using a Causal Quality Model and Deep Learning
Das et al. Bayesian Statistical Model Checking for Multi-agent Systems using HyperPCTL
Kansal et al. Forecasting the reliability of software via neural networks