Verran et al., 2000 - Google Patents
The use of the atomic force microscope to visualise and measure wear of food contact surfacesVerran et al., 2000
- Document ID
- 11111834019682692977
- Author
- Verran J
- Rowe D
- Cole D
- Boyd R
- Publication year
- Publication venue
- International biodeterioration & biodegradation
External Links
Snippet
The atomic force microscope (AFM) promises to be a valuable tool for visualising and measuring the wear of food contact surfaces. Samples examined by the AFM require virtually no preparation, and the AFM gives roughness information down to the nanometer …
- 235000013305 food 0 title abstract description 30
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
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