[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Gregory et al., 2010 - Google Patents

Strain and temperature effects in indium–tin-oxide sensors

Gregory et al., 2010

Document ID
10898417617612442325
Author
Gregory O
Chen X
Crisman E
Publication year
Publication venue
Thin Solid Films

External Links

Snippet

Indium–tin-oxide (ITO) thin films strain gages were prepared by reactive sputtering onto both high purity alumina and lanthanum stabilized zirconia substrates. We report the piezoresistive response of these ITO gages in the temperature range 350–1500° C up to …
Continue reading at www.sciencedirect.com (other versions)

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress in general
    • G01L1/20Measuring force or stress in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electro-kinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22Measuring force or stress in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electro-kinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2287Measuring force or stress in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electro-kinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges constructional details of the strain gauges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/026Specifications of the specimen
    • G01N2203/0286Miniature specimen; Testing on micro-regions of a specimen
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0058Kind of property studied
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic means
    • G01B7/16Measuring arrangements characterised by the use of electric or magnetic means for measuring deformation in a solid, e.g. by resistance strain gauge
    • G01B7/22Measuring arrangements characterised by the use of electric or magnetic means for measuring deformation in a solid, e.g. by resistance strain gauge using change in capacitance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/02Details
    • G01N3/06Special adaptations of indicating or recording means
    • G01N3/066Special adaptations of indicating or recording means with electrical indicating or recording means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating the impedance of the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L5/00Apparatus for, or methods of, measuring force, e.g. due to impact, work, mechanical power, or torque, adapted for special purposes
    • G01L5/0047Apparatus for, or methods of, measuring force, e.g. due to impact, work, mechanical power, or torque, adapted for special purposes measuring forces due to residual stresses

Similar Documents

Publication Publication Date Title
Kazi et al. The electromechanical behavior of nichrome (80/20 wt.%) film
Gregory et al. High temperature stability of indium tin oxide thin films
Huang et al. Tensile testing of free-standing Cu, Ag and Al thin films and Ag/Cu multilayers
Muhlstein et al. A reaction-layer mechanism for the delayed failure of micron-scale polycrystalline silicon structural films subjected to high-cycle fatigue loading
Liu et al. High temperature static and dynamic strain response of PdCr thin film strain gauge prepared on Ni-based superalloy
US20090173162A1 (en) High temperature strain gages
Odén et al. The effects of bias voltage and annealing on the microstructure and residual stress of arc-evaporated Cr–N coatings
Steffes et al. Fabrication parameters and NO2 sensitivity of reactively RF-sputtered In2O3 thin films
Gregory et al. A self-compensated ceramic strain gage for use at elevated temperatures
Gregory et al. Strain and temperature effects in indium–tin-oxide sensors
Wang et al. Investigation of TBCs on turbine blades by photoluminescence piezospectroscopy
Liu et al. Effect of nitrogen partial pressure on the piezoresistivity of magnetron sputtered ITO thin films at high temperatures
Franke et al. Temperature dependence of the indentation size effect
Jin et al. High temperature failure modes of In2O3 thin films and improved thermal stability using Al2O3/ZrO2 protective layers
Gregory et al. An apparent n to p transition in reactively sputtered indium–tin–oxide high temperature strain gages
Kalpana et al. Development of the invar36 thin film strain gauge sensor for strain measurement
Kreider et al. Thin-film resistance thermometers on silicon wafers
Pfeiffer et al. Miniaturized bend tests on partially stabilized EB-PVD ZrO2 thermal barrier coatings
Zhang et al. A bilayer thin-film strain gauge with temperature self-compensation
Gregory et al. Piezoresistive properties of ITO strain sensors prepared with controlled nanoporosity
Wen et al. Evolution of photo-stimulated luminescence of EB-PVD/(Ni, Pt) Al thermal barrier coatings
Kang et al. Creep properties of a thermally grown alumina
Sharma et al. High temperature creep and tensile properties of alumina formed on Fecralloy foils doped with yttrium
Lu et al. Nanoindentation and residual stress measurements of yttria-stablized zirconia composite coatings produced by electrophoretic deposition
Zhao et al. 3D Printing of Platinum-Rhodium High-temperature Thick Film Strain Gauge