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Chishti et al., 2009 - Google Patents

Improving cache lifetime reliability at ultra-low voltages

Chishti et al., 2009

View PDF
Document ID
10752823997739959804
Author
Chishti Z
Alameldeen A
Wilkerson C
Wu W
Lu S
Publication year
Publication venue
Proceedings of the 42nd Annual IEEE/ACM International Symposium on Microarchitecture

External Links

Snippet

Voltage scaling is one of the most effective mechanisms to reduce microprocessor power consumption. However, the increased severity of manufacturing-induced parameter variations at lower voltages limits voltage scaling to a minimum voltage, Vccmin, below …
Continue reading at www.academia.edu (PDF) (other versions)

Classifications

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