Gorthi et al., 2010 - Google Patents
Fringe projection techniques: whither we are?Gorthi et al., 2010
View PDF- Document ID
- 1057908290542037996
- Author
- Gorthi S
- Rastogi P
- Publication year
- Publication venue
- Optics and lasers in engineering
External Links
Snippet
During recent years, the use of fringe projection techniques for generating three- dimensional (3D) surface information has become one of the most active research areas in optical metrology. Its applications range from measuring the 3D shape of MEMS …
- 238000000034 method 0 title abstract description 50
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical means
- G01B11/24—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2536—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings with variable grating pitch, projected on the object with the same angle of incidence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Instruments as specified in the subgroups and characterised by the use of optical measuring means
- G01B9/02—Interferometers for determining dimensional properties of, or relations between, measurement objects
- G01B9/02001—Interferometers for determining dimensional properties of, or relations between, measurement objects characterised by manipulating or generating specific radiation properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical means
- G01B11/24—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures
- G01B11/2441—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures using interferometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical means
- G01B11/02—Measuring arrangements characterised by the use of optical means for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical means for measuring length, width or thickness for measuring thickness, e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical means for measuring length, width or thickness for measuring thickness, e.g. of sheet material of coating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Instruments as specified in the subgroups and characterised by the use of optical measuring means
- G01B9/02—Interferometers for determining dimensional properties of, or relations between, measurement objects
- G01B9/02083—Interferometers for determining dimensional properties of, or relations between, measurement objects characterised by particular signal processing and presentation
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20048—Transform domain processing
- G06T2207/20056—Discrete and fast Fourier transform, [DFT, FFT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Gorthi et al. | Fringe projection techniques: whither we are? | |
| Huang et al. | Review of phase measuring deflectometry | |
| CN106931910B (en) | A kind of efficient acquiring three-dimensional images method based on multi-modal composite coding and epipolar-line constraint | |
| Su et al. | Fourier transform profilometry:: a review | |
| Su et al. | Dynamic 3-D shape measurement method based on FTP | |
| Zhang et al. | An optical measurement of vortex shape at a free surface | |
| Zhao et al. | Performance analysis and evaluation of direct phase measuring deflectometry | |
| Jia et al. | Two-step triangular-pattern phase-shifting method for three-dimensional object-shape measurement | |
| Jia et al. | Comparison of linear and nonlinear calibration methods for phase-measuring profilometry | |
| WO2021184686A1 (en) | Single-frame stripe analysis method based on multi-scale generative adversarial neural network | |
| Lyu et al. | Structured light-based underwater 3-D reconstruction techniques: A comparative study | |
| Xiao et al. | Large-scale structured light 3D shape measurement with reverse photography | |
| Pei et al. | Profile measurement of non-Lambertian surfaces by integrating fringe projection profilometry with near-field photometric stereo | |
| Yang et al. | Single-shot N-step phase measurement profilometry | |
| Jiang et al. | High-precision composite 3D shape measurement of aeroengine blade based on parallel single-pixel imaging and high-dynamic range N-step fringe projection profilometry | |
| Hodgson et al. | Novel metrics and methodology for the characterisation of 3D imaging systems | |
| Chen et al. | Improving Fourier transform profilometry based on bicolor fringe pattern | |
| Deng et al. | Spatial modulation-assisted scanning white-light interferometry for noise suppression | |
| Spagnolo et al. | Fringe projection profilometry for recovering 2.5 D shape of ancient coins | |
| Zhu et al. | Single frame phase estimation based on Hilbert transform and Lissajous ellipse fitting method in fringe projection technology | |
| Yagnik et al. | 3D shape extraction of human face in presence of facial hair: A profilometric approach | |
| Wang et al. | Subfringe integration method for automatic analysis of moire deflection tomography | |
| Liu et al. | Double transmission-mediums based geometric phase analysis for determining the two surface profiles of transparent object | |
| Kayaba et al. | Non-contact full field vibration measurement based on phase-shifting | |
| Tao et al. | High-precision phase extraction and unwrapping method for MEMS mirror structured light system |