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Song et al., 1998 - Google Patents

Degradation of AlGaAs/GaAs HBTs induced by hot carriers

Song et al., 1998

Document ID
10438673716823146928
Author
Song C
Kim D
Choi P
Choi J
Kim D
Publication year
Publication venue
Microelectronics Reliability

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Snippet

In AlGaAs/GaAs HBTs, the instability of the surface states of the extrinsic base, which is revealed by mesa-etching and passivated by Si3N4, affects reliability. In this study the reverse constant current stress in an avalanche regime is applied across the emitter–base …
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