[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Karakaya et al., 2024 - Google Patents

Electro-thermal Trade-off for AC-Current Injection & Series-Clamping-Diodes Based R ds-on Estimation Circuit

Karakaya et al., 2024

Document ID
10356358614609292262
Author
Karakaya F
Maheshwari A
Banerjee A
Donnal J
Publication year
Publication venue
2024 IEEE Applied Power Electronics Conference and Exposition (APEC)

External Links

Snippet

Series double diode (SDD) configuration with ac current injection allows online estimation of on-state resistance without the need for current measurement. However, challenges arise from the high-frequency ac current injection, which requires minimizing the ac current-loop …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/13Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304Transistor
    • H01L2924/1305Bipolar Junction Transistor [BJT]
    • H01L2924/13055Insulated gate bipolar transistor [IGBT]
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation; Temperature sensing arrangements
    • HELECTRICITY
    • H03BASIC ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making or -braking
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02MAPPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M7/00Conversion of ac power input into dc power output; Conversion of dc power input into ac power output
    • H02M7/003Constructional details, e.g. physical layout, assembly, wiring, busbar connections
    • HELECTRICITY
    • H03BASIC ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F3/00Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • HELECTRICITY
    • H03BASIC ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F1/00Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements

Similar Documents

Publication Publication Date Title
CN111337808B (en) On-line measuring circuit and system for conduction voltage drop of power semiconductor device
US10431424B2 (en) Parasitic capacitance compensation circuit
US9513318B2 (en) Current or voltage sensing
JP2572697B2 (en) Low impedance overvoltage protection circuit
JP5664536B2 (en) Current detection circuit and semiconductor integrated circuit device
WO2018227998A1 (en) Temperature compensation circuit and radio frequency power amplifying circuit for radio frequency power amplifier
EP1143602A2 (en) Active filter for reduction of common mode current
KR100371116B1 (en) Power semiconductor module
US20210021258A1 (en) Method And Apparatus For Eliminating Crosstalk Effects In High Switching-Speed Power Modules
TW201036326A (en) Constant switch Vgs circuit for minimizing rflatness and improving audio performance
Spang et al. Evaluation of current measurement accuracy for a power module with integrated shunt resistors
US20140269840A1 (en) Temperature detecting circuit and method thereof
CN107942120A (en) Current detection circuit and electric current detecting method
Shelton et al. Low inductance switching for SiC MOSFET based power circuit
Rossetto et al. A fast on-state voltage measurement circuit for power devices characterization
Karakaya et al. Electro-thermal Trade-off for AC-Current Injection & Series-Clamping-Diodes Based R ds-on Estimation Circuit
Meissner et al. Current measurement of GaN power devices using a frequency compensated SMD shunt
US20230314487A1 (en) On-state voltage measurement of high-side and low-side power transistors in a half-bridge for in-situ prognostics
Philipps et al. Low inductive platform for long-and short-term dynamic charaterization of SiC MOSFETs
CN117517910A (en) Junction temperature detection circuit, junction temperature detection method and system of power device
Sangid et al. Comparison of 60V GaN and Si devices for Class D audio applications
Bilbao et al. Development and testing of an active high voltage saturation probe for characterization of ultra-high voltage silicon carbide semiconductor devices
Sergentanis et al. Dynamic Characterization of 650V GaN HEMT Transistors
CN117169675B (en) On-line monitoring circuit for conduction voltage drop of inverter-stage wide-temperature-zone power device
JP6271285B2 (en) Semiconductor test equipment