Lyding et al., 1988 - Google Patents
Variable‐temperature scanning tunneling microscopeLyding et al., 1988
- Document ID
- 10126557959901348410
- Author
- Lyding J
- Skala S
- Hubacek J
- Brockenbrough R
- Gammie G
- Publication year
- Publication venue
- Review of scientific instruments
External Links
Snippet
A thermally compensated tube scanner scanning tunneling microscope (STM) ha'> been constructed and successfuHy tested. This design utilizes two concentric piezoelectric tubes, one for scanning and one for thermal compensation and inertial sample translation (over …
- 230000005641 tunneling 0 title abstract description 48
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
- G01Q10/04—Fine scanning or positioning
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular type of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/10—STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
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