Gharaibeh et al., 2011 - Google Patents
Photoionization measurements for the iron isonuclear sequence Fe 3+, Fe 5+, and Fe 7+Gharaibeh et al., 2011
View PDF- Document ID
- 10154376389320481147
- Author
- Gharaibeh M
- Aguilar A
- Covington A
- Emmons E
- Scully S
- Phaneuf R
- Müller A
- Bozek J
- Kilcoyne A
- Schlachter A
- Alvarez I
- Cisneros C
- Hinojosa G
- Publication year
- Publication venue
- Physical Review A—Atomic, Molecular, and Optical Physics
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Snippet
Cross sections for single photoionization of Fe 3+, Fe 5+, and Fe 7+ ions were measured at spectral resolutions of 0.04, 0.15, and 0.13 eV, respectively, by merging mass-and charge- selected ion beams with a beam of monochromatized synchrotron undulator radiation. The …
- 238000005259 measurement 0 title abstract description 65
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam
- G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam with incident electron beam
- G01N23/2252—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam with incident electron beam and measuring excited X-rays
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