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Chen et al., 2021 - Google Patents

Digital twin for degradation parameters identification of dc-dc converters based on bayesian optimization

Chen et al., 2021

Document ID
10003396274142458539
Author
Chen S
Wang S
Wen P
Zhao S
Publication year
Publication venue
2021 IEEE International Conference on Prognostics and Health Management (ICPHM)

External Links

Snippet

Power electronic circuits have been widely used in various fields, and the requirements for their stability and reliability has increased. Therefore, a degradation parameters identification method of the DC-DC power converters is proposed. The main idea of this …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
    • G06F17/5009—Computer-aided design using simulation
    • G06F17/5036—Computer-aided design using simulation for analog modelling, e.g. for circuits, spice programme, direct methods, relaxation methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising

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