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Kiyota et al., 2000 - Google Patents

Reduction of base resistance and increase in cutoff frequency of Si bipolar transistor using rapid vapor-phase doping

Kiyota et al., 2000

Document ID
10085899107978034674
Author
Kiyota Y
Kikuchi T
Washio K
Inada T
Publication year
Publication venue
Japanese Journal of Applied Physics

External Links

Snippet

The shallow intrinsic base region of a double poly-Si self-aligned bipolar transistor was formed by rapid vapor-phase doping (RVD) in order to increase the high-frequency performance, compared to that provided by low-energy BF 2 ion implantation. RVD …
Continue reading at iopscience.iop.org (other versions)

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    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer, carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
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