[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Clement et al., 2002 - Google Patents

Calibrating photoreceiver response to 110 GHz

Clement et al., 2002

View PDF
Document ID
9770445582140596780
Author
Clement T
Williams D
Hale P
Morgan J
Publication year
Publication venue
The 15th Annual Meeting of the IEEE Lasers and Electro-Optics Society

External Links

Snippet

Calibrating photoreceiver response to 110 GHz Page 1 ThAA4 17:15-17:30 Calibrating photoreceiver response to 110 GHz Tracy S. Clement, Dylan F. Williams, Paul D. Hale, and Juanita M. Morgan National Institute of Standards and Technology, 325 Broadway, Boulder …
Continue reading at www.nist.gov (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuit
    • G01R31/31903—Tester hardware, i.e. output processing circuit tester configuration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0878—Sensors; antennas; probes; detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G01R31/11—Locating faults in cables, transmission lines, or networks using pulse reflection methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes; Oscilloscopes using other screens than CRT's, e.g. LCD's
    • G01R13/22—Circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the preceding groups
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00 and G01R33/00 - G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R21/00—Arrangements for measuring electric power or power factor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers

Similar Documents

Publication Publication Date Title
Clement et al. Calibration of sampling oscilloscopes with high-speed photodiodes
Hale et al. Waveform metrology: signal measurements in a modulated world
Füser et al. Optoelectronic time-domain characterization of a 100 GHz sampling oscilloscope
Williams et al. Calibrating electro-optic sampling systems
Hale et al. Traceable waveform calibration with a covariance-based uncertainty analysis
US4745361A (en) Electro-optic measurement (network analysis) system
Hale et al. Traceability of high-speed electrical waveforms at NIST, NPL, and PTB
Clement et al. Calibrating photoreceiver response to 110 GHz
Adam A new precision automatic microwave measurement system
Henderson et al. Calibration of fast sampling oscilloscopes
Williams et al. Terminology for high-speed sampling-oscilloscope calibration
US6259244B1 (en) Electrooptic voltage waveform measuring method employing light sampling technique using Pockels effect
Williams et al. Calibrated 200-GHz waveform measurement
Williams et al. Mismatch corrections for electro-optic sampling systems
Bieler et al. Improved optoelectronic technique for the time-domain characterization of sampling oscilloscopes
Struszewski et al. Asynchronous optical sampling for laser-based vector network analysis on coplanar waveguides
Hale et al. Measuring the frequency response of gigabit chip photodiodes
Paulter et al. An examination of the spectra of the" Kick-Out" pulses for a proposed sampling oscilloscope calibration method
Hale et al. Frequency response metrology for high-speed optical receivers
Humphreys et al. Characterization and behavior of comb phase-standards
Williams et al. Sampling-oscilloscope measurement of a microwave mixer with single-digit phase accuracy
Brevik et al. A cryogenic quantum-based RF source
Majidi-Ahy et al. 100 GHz on-wafer S-parameter measurements by electrooptic sampling
Humphreys et al. Vector calibration of optical reference receivers using a frequency-domain method
Scott et al. Enhanced on-wafer time-domain waveform measurement through removal of interconnect dispersion and measurement instrument jitter