Becker et al., 1976 - Google Patents
Ionization of non-volatile organic compounds by fast heavy ions and their separation by mass spectrometryBecker et al., 1976
- Document ID
- 9700374161282828318
- Author
- Becker O
- Fürstenau N
- Krueger F
- Weiβ G
- Wien K
- Publication year
- Publication venue
- Nuclear Instruments and Methods
External Links
Snippet
Fast heavy ions traversing a thin layer of non-volatile organic compounds volatilize and ionize the sample molecules. Their separation by time-of-flight mass spectrometry is described and the additional information obtainable by magnetic spectrometry is indicated …
- 150000002500 ions 0 title abstract description 51
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
- H01J49/405—Time-of-flight spectrometers characterised by the reflectron, e.g. curved field, electrode shapes
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
- H01J49/403—Time-of-flight spectrometers characterised by the acceleration optics and/or the extraction fields
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/30—Static spectrometers using magnetic analysers, e.g. Dempster spectrometer
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/025—Detectors specially adapted to particle spectrometers
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/0027—Methods for using particle spectrometers
- H01J49/0036—Step by step routines describing the handling of the data generated during a measurement
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
- H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
- H01J47/06—Proportional counter tubes
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Chait et al. | A time-of-flight mass spectrometer for measurement of secondary ion mass spectra | |
Straub et al. | Absolute partial cross sections for electron-impact ionization of H 2, N 2, and O 2 from threshold to 1000 eV | |
Della-Negra et al. | New method for metastable ion studies with a time of flight mass spectrometer. Future application to molecular structure determinations | |
Geno et al. | Secondary electron emission induced by impact of low-velocity molecular ions on a microchannel plate | |
Håkansson et al. | The velocity dependence of fast heavy-ion induced desorption of biomolecules | |
Eubank et al. | Ion energy analyzer for plasma measurements | |
Della Negra et al. | A 252Cf time-of-flight mass spectrometer with improved mass resolution | |
Groh et al. | Transfer ionisation in slow collisions of multiply-charged ions with atoms | |
Barat et al. | Coincident energy gain spectroscopy of electron capture in multiply charged ions colliding with He, H2 and heavy rare-gas targets | |
Edwards et al. | Collisional ionization and excitation of H 2: Two-electron processes | |
Mangan et al. | Absolute partialcross sections for electron-impact ionization of CO fromthreshold to 1000 eV | |
Becker et al. | Ionization of non-volatile organic compounds by fast heavy ions and their separation by mass spectrometry | |
Ben-Hamu et al. | Energy loss of fast clusters through matter | |
Andersson et al. | Total cross sections for different charge changing processes in collisions of highly charged Xe ions with He atoms at low energy | |
Shah et al. | Ionisation and electron capture in collisions of H+ and He2+ ions with carbon monoxide | |
Gspann | Negatively charged helium-4 clusters | |
Sundqvist et al. | Plasma desorption mass spectrometry (PDMS). Limitations and possibilities | |
Danigel et al. | A 252Cf fission fragment-induced desorption mass spectrometer: Design, operation and performance | |
Brunelle et al. | High desorption—ionization yields of large biomolecules induced by fast C60 projectiles | |
Meierjohann et al. | A study of the collisional dissociation of H2+ ions with a flight-time difference method | |
US7781730B2 (en) | Linear electronic field time-of-flight ion mass spectrometers | |
Matic et al. | Electron loss by C-and O-ions in gaseous targets | |
Banner et al. | Simultaneous measurement of flight time and energy of large matrix-assisted laser desorption ionization ions with a superconducting tunnel junction detector | |
US11410843B1 (en) | Mass spectrometry system and measuring method thereof | |
Alinovskii et al. | A time-of-flight detector of low-energy ions for an accelerating mass-spectrometer |