[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Weimer et al., 2015 - Google Patents

Context-aware deep convolutional neural networks for industrial inspection

Weimer et al., 2015

View PDF
Document ID
9649819872398245451
Author
Weimer D
Benggolo A
Freitag M
Publication year
Publication venue
Australas. Conf. Artif. Intell

External Links

Snippet

This contribution presents the application of deep Convolutional Neural Networks (CNN) for surface defect detection in manufacturing processes. On a classification task with 12 defect categories we analyze the impact of context-aware patch extraction on the detection result …
Continue reading at www.researchgate.net (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30148—Semiconductor; IC; Wafer
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/62—Methods or arrangements for recognition using electronic means
    • G06K9/6267—Classification techniques
    • G06K9/6268—Classification techniques relating to the classification paradigm, e.g. parametric or non-parametric approaches
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/62—Methods or arrangements for recognition using electronic means
    • G06K9/6217—Design or setup of recognition systems and techniques; Extraction of features in feature space; Clustering techniques; Blind source separation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/36—Image preprocessing, i.e. processing the image information without deciding about the identity of the image
    • G06K9/46—Extraction of features or characteristics of the image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/62—Methods or arrangements for recognition using electronic means
    • G06K9/6201—Matching; Proximity measures
    • G06K9/6202—Comparing pixel values or logical combinations thereof, or feature values having positional relevance, e.g. template matching
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10024—Color image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/00127—Acquiring and recognising microscopic objects, e.g. biological cells and cellular parts
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/00221—Acquiring or recognising human faces, facial parts, facial sketches, facial expressions
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06N—COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N99/00—Subject matter not provided for in other groups of this subclass

Similar Documents

Publication Publication Date Title
Park et al. Ambiguous surface defect image classification of AMOLED displays in smartphones
Weimer et al. Design of deep convolutional neural network architectures for automated feature extraction in industrial inspection
US10860879B2 (en) Deep convolutional neural networks for crack detection from image data
Shanmugamani et al. Detection and classification of surface defects of gun barrels using computer vision and machine learning
Martins et al. Automatic detection of surface defects on rolled steel using computer vision and artificial neural networks
Rezazadegan et al. Action recognition: From static datasets to moving robots
Bong et al. Vision-based inspection system for leather surface defect detection and classification
Xie et al. A novel defect detection and identification method in optical inspection
Park et al. Advanced cover glass defect detection and classification based on multi-DNN model
CN116978834A (en) Intelligent monitoring and early warning system for wafer production
Weimer et al. Context-aware deep convolutional neural networks for industrial inspection
Liong et al. Moving towards agriculture 4.0: An AI-AOI carrot inspection system with accurate geometric properties
KR20210086303A (en) Pattern inspection apparatus based on deep learning and inspection method using the same
Sauter et al. Defect detection of metal nuts applying convolutional neural networks
Metzner et al. Automated optical inspection of soldering connections in power electronics production using convolutional neural networks
US20220237894A1 (en) Surface recognition
Maiti et al. Classification of materials in cylindrical workpieces using image processing and machine learning techniques
Chang et al. Learning vector quantization neural networks for LED wafer defect inspection
Goga et al. Hand gesture recognition using 3D sensors
Hagelskjær et al. Keymatchnet: Zero-shot pose estimation in 3d point clouds by generalized keypoint matching
Alkapov et al. Automatic visible defect detection and classification system prototype development for iron-and-steel works
EP4213091B1 (en) Physics-informed anomaly detection in formed metal parts
Yang et al. Cherry recognition based on color channel transform
Cao et al. Tube defect detection algorithm under noisy environment using feature vector and neural networks
Tan et al. Research on YOLOv8 Application in Bolt and Nut Detection for Robotic Arm Vision