[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Mottram et al., 2020 - Google Patents

A feasibility investigation of speciation by Fe K-edge XANES using a laboratory X-ray absorption spectrometer

Mottram et al., 2020

View PDF
Document ID
9590090213205713693
Author
Mottram L
Cafferkey S
Mason A
Oulton T
Sun S
Bailey D
Stennett M
Hyatt N
Publication year
Publication venue
Journal of Geosciences

External Links

Snippet

We demonstrate effective speciation of Fe in model compounds from analysis of the weak pre-edge features in Fe K-edge XANES spectra, with a commercially available laboratory X- ray spectrometer, using a spherically bent crystal analyser and a low-power X-ray tube, in …
Continue reading at www.jgeosci.org (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation
    • G01N23/207—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation by means of diffractometry using detectors, e.g. using an analysing crystal or a crystal to be analysed in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation by means of diffractometry using detectors, e.g. using an analysing crystal or a crystal to be analysed in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam with incident electron beam
    • G01N23/2252—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam with incident electron beam and measuring excited X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials

Similar Documents

Publication Publication Date Title
Mottram et al. A feasibility investigation of speciation by Fe K-edge XANES using a laboratory X-ray absorption spectrometer
Jahrman et al. An improved laboratory-based x-ray absorption fine structure and x-ray emission spectrometer for analytical applications in materials chemistry research
Pyle et al. Electron microprobe analysis of REE in apatite, monazite and xenotime: protocols and pitfalls
Höfer et al. The iron oxidation state of garnet by electron microprobe: Its determination with the flank method combined with major-element analysis
Taggart et al. Analysis of geologic materials by wavelength-dispersive X-ray fluorescence spectrometry
Ning et al. Electron probe microanalysis of monazite and its applications to U-Th-Pb dating of geological samples
Jercinovic et al. In-situ trace element analysis of monazite and other fine-grained accessory minerals by EPMA
Fialin et al. Fe3+/∑ Fe vs. Fe L α peak energy for minerals and glasses: Recent advances with the electron microprobe
Will et al. Refinement of simple crystal structures from synchrotron radiation powder diffraction data
Malzer et al. A laboratory spectrometer for high throughput X-ray emission spectroscopy in catalysis research
Dallera et al. Looking 100 Å deep into spatially inhomogeneous dilute systems with hard X-ray photoemission
Nesbitt et al. High resolution core-and valence-level XPS studies of the properties (structural, chemical and bonding) of silicate minerals and glasses
Mortensen et al. Benchtop nonresonant X-ray emission spectroscopy: coming soon to laboratories and XAS beamlines near you?
Haukka et al. Total X‐ray fluorescence analysis of geological samples using a low‐dilution lithium metaborate fusion method. Matrix corrections for major elements
Yokoyama et al. Investigating the influence of non‐spectral matrix effects in the determination of twenty‐two trace elements in rock samples by ICP‐QMS
Dyar et al. Accurate determination of ferric iron in garnets by bulk Mössbauer spectroscopy and synchrotron micro-XANES
Vitova et al. Exploring the electronic structure and speciation of aqueous and colloidal Pu with high energy resolution XANES and computations
McCanta et al. Iron partitioning between basaltic melts and clinopyroxene as a function of oxygen fugacity
Mottram et al. A feasibility investigation of laboratory based X-ray absorption spectroscopy in support of nuclear waste management
Sutton et al. Oxybarometry and valence quantification based on microscale X-ray absorption fine structure (XAFS) spectroscopy of multivalent elements
Martin et al. A XAS study of the local environments of cations in (U, Ce) O2
Cartier et al. Evidence for Nb2+ and Ta3+ in silicate melts under highly reducing conditions: A XANES study
Ichikawa et al. X-ray fluorescence determination using glass bead samples and synthetic calibration standards for reliable routine analyses of ancient pottery
Zhang et al. A reliable calibration method for accurate determination of major and trace elements in fluorapatite by LA-ICP-MS without an internal standard
Mikhailov et al. Dependence of the Compton to Rayleigh intensity ratio on the scatterer atomic number in the range of 4 (Be) to 31 (Ga)