O'connor et al., 1986 - Google Patents
The amorphous character and particle size distributions of powders produced with the Micronizing Mill for quantitative x‐ray powder diffractometryO'connor et al., 1986
- Document ID
- 9400259034332951102
- Author
- O'connor B
- Chang W
- Publication year
- Publication venue
- X‐ray Spectrometry
External Links
Snippet
The rapid rise in the popularity of the McCrone Micronizing Mill for sample preparation in routine quantitative analytical x‐ray powder diffractometry (XRPD) has led to the present examination of material obtained with the device and a comparison with material produced …
- 239000002245 particle 0 title abstract description 33
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation
- G01N23/207—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation by means of diffractometry using detectors, e.g. using an analysing crystal or a crystal to be analysed in a central position and one or more displaceable detectors in circumferential positions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by the preceding groups
- G01N33/38—Investigating or analysing materials by specific methods not covered by the preceding groups concrete; ceramics; glass; bricks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/10—Devices for withdrawing samples in the liquid or fluent state
- G01N1/20—Devices for withdrawing samples in the liquid or fluent state for flowing or falling materials
- G01N2001/2092—Cross-cut sampling
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/04—Devices for withdrawing samples in the solid state, e.g. by cutting
Similar Documents
Publication | Publication Date | Title |
---|---|---|
O'connor et al. | The amorphous character and particle size distributions of powders produced with the Micronizing Mill for quantitative x‐ray powder diffractometry | |
Owen et al. | X-ray diffraction at ultra-high pressures | |
Bish et al. | Sample preparation for X-ray diffraction | |
Holdren Jr et al. | Reaction rate-surface area relationships during the early stages of weathering. II. Data on eight additional feldspars | |
Hurst et al. | Accurate quantification of quartz and other phases by powder X-ray diffractometry | |
Witz | Focusing monochromators | |
Toraya et al. | Preferred orientation correction in powder pattern-fitting | |
Ungár et al. | Revealing the powdering methods of black makeup in Ancient Egypt by fitting microstructure based Fourier coefficients to the whole x-ray diffraction profiles of galena | |
Meixner et al. | Sin2ψ-based residual stress gradient analysis by energy-dispersive synchrotron diffraction constrained by small gauge volumes. II. Experimental implementation | |
Whitehead et al. | Laser-spark excitation of homogeneous powdered materials | |
Calvert et al. | A comparison of methods for reducing preferred orientation | |
Wu et al. | A tunable x-ray microprobe using synchrotron radiation | |
Bernstein | Application of X-ray fluorescence analysis to process control | |
O'Connor et al. | Micronizing Mill for Quantitative X-Ray Powder Diffractometrv | |
Batterman | X-Ray Measurement of the Atomic Scattering Factor of Iron | |
Frolow et al. | Single crystal synchrotron X-ray diffraction of CuInSe2 | |
Schieber et al. | Correlation between mercuric iodide detector performance and crystalline perfection | |
De Woolf et al. | Absolute intensities-outline of a recommended practice | |
Welberry et al. | High-energy diffuse scattering on the 1-ID beamline at the Advanced Photon Source | |
Gilkes | Transmission electron microscope analysis of soil materials | |
Suder et al. | Thin solid film sample preparation by a small-angle cleavage for transmission electron microscopy | |
FUKUOKA et al. | Evaluation of crystallite orientation in tablets by X-ray diffraction methods | |
Iida et al. | Micro x‐ray diffraction technique for analysis of the local layer structure in the ferroelectric liquid crystal | |
Saisho | X-ray fluorescence analysis using synchrotron radiation | |
Hursta et al. | Accurate quantification of quartz and other phases by powder X-ray diffractrometry |