[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

O'connor et al., 1986 - Google Patents

The amorphous character and particle size distributions of powders produced with the Micronizing Mill for quantitative x‐ray powder diffractometry

O'connor et al., 1986

Document ID
9400259034332951102
Author
O'connor B
Chang W
Publication year
Publication venue
X‐ray Spectrometry

External Links

Snippet

The rapid rise in the popularity of the McCrone Micronizing Mill for sample preparation in routine quantitative analytical x‐ray powder diffractometry (XRPD) has led to the present examination of material obtained with the device and a comparison with material produced …
Continue reading at analyticalsciencejournals.onlinelibrary.wiley.com (other versions)

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation
    • G01N23/207Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation by means of diffractometry using detectors, e.g. using an analysing crystal or a crystal to be analysed in a central position and one or more displaceable detectors in circumferential positions
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/02Investigating particle size or size distribution
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by the preceding groups
    • G01N33/38Investigating or analysing materials by specific methods not covered by the preceding groups concrete; ceramics; glass; bricks
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/02Devices for withdrawing samples
    • G01N1/10Devices for withdrawing samples in the liquid or fluent state
    • G01N1/20Devices for withdrawing samples in the liquid or fluent state for flowing or falling materials
    • G01N2001/2092Cross-cut sampling
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/02Devices for withdrawing samples
    • G01N1/04Devices for withdrawing samples in the solid state, e.g. by cutting

Similar Documents

Publication Publication Date Title
O'connor et al. The amorphous character and particle size distributions of powders produced with the Micronizing Mill for quantitative x‐ray powder diffractometry
Owen et al. X-ray diffraction at ultra-high pressures
Bish et al. Sample preparation for X-ray diffraction
Holdren Jr et al. Reaction rate-surface area relationships during the early stages of weathering. II. Data on eight additional feldspars
Hurst et al. Accurate quantification of quartz and other phases by powder X-ray diffractometry
Witz Focusing monochromators
Toraya et al. Preferred orientation correction in powder pattern-fitting
Ungár et al. Revealing the powdering methods of black makeup in Ancient Egypt by fitting microstructure based Fourier coefficients to the whole x-ray diffraction profiles of galena
Meixner et al. Sin2ψ-based residual stress gradient analysis by energy-dispersive synchrotron diffraction constrained by small gauge volumes. II. Experimental implementation
Whitehead et al. Laser-spark excitation of homogeneous powdered materials
Calvert et al. A comparison of methods for reducing preferred orientation
Wu et al. A tunable x-ray microprobe using synchrotron radiation
Bernstein Application of X-ray fluorescence analysis to process control
O'Connor et al. Micronizing Mill for Quantitative X-Ray Powder Diffractometrv
Batterman X-Ray Measurement of the Atomic Scattering Factor of Iron
Frolow et al. Single crystal synchrotron X-ray diffraction of CuInSe2
Schieber et al. Correlation between mercuric iodide detector performance and crystalline perfection
De Woolf et al. Absolute intensities-outline of a recommended practice
Welberry et al. High-energy diffuse scattering on the 1-ID beamline at the Advanced Photon Source
Gilkes Transmission electron microscope analysis of soil materials
Suder et al. Thin solid film sample preparation by a small-angle cleavage for transmission electron microscopy
FUKUOKA et al. Evaluation of crystallite orientation in tablets by X-ray diffraction methods
Iida et al. Micro x‐ray diffraction technique for analysis of the local layer structure in the ferroelectric liquid crystal
Saisho X-ray fluorescence analysis using synchrotron radiation
Hursta et al. Accurate quantification of quartz and other phases by powder X-ray diffractrometry