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Crotti et al., 2015 - Google Patents

A 2-GHz bandwidth, integrated transimpedance amplifier for single-photon timing applications

Crotti et al., 2015

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Document ID
9359746403274399536
Author
Crotti M
Rech I
Acconcia G
Gulinatti A
Ghioni M
Publication year
Publication venue
IEEE Transactions on Very Large Scale Integration (VLSI) Systems

External Links

Snippet

In recent years, single-photon timing techniques have been employed in a steadily increasing number of applications. Most of these applications require high detector performance in terms of noise, photon detection efficiency, time resolution, and number of …
Continue reading at re.public.polimi.it (PDF) (other versions)

Classifications

    • HELECTRICITY
    • H03BASIC ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F3/00Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45Differential amplifiers
    • H03F3/45071Differential amplifiers with semiconductor devices only
    • H03F3/45076Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • HELECTRICITY
    • H03BASIC ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F3/00Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/04Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only
    • H03F3/08Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only controlled by light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer

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