Crotti et al., 2015 - Google Patents
A 2-GHz bandwidth, integrated transimpedance amplifier for single-photon timing applicationsCrotti et al., 2015
View PDF- Document ID
- 9359746403274399536
- Author
- Crotti M
- Rech I
- Acconcia G
- Gulinatti A
- Ghioni M
- Publication year
- Publication venue
- IEEE Transactions on Very Large Scale Integration (VLSI) Systems
External Links
Snippet
In recent years, single-photon timing techniques have been employed in a steadily increasing number of applications. Most of these applications require high detector performance in terms of noise, photon detection efficiency, time resolution, and number of …
- 238000001514 detection method 0 abstract description 24
Classifications
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/04—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only
- H03F3/08—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only controlled by light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Crotti et al. | Four channel, 40 ps resolution, fully integrated time-to-amplitude converter for time-resolved photon counting | |
Anghinolfi et al. | NINO, an ultra-fast, low-power, front-end amplifier discriminator for the Time-Of-Flight detector in ALICE experiment | |
Calò et al. | SiPM readout electronics | |
JP6212605B2 (en) | Photoreceiver having Geiger mode avalanche photodiode and readout method | |
Chong et al. | Low-noise wide-band amplifiers in bipolar and CMOS technologies | |
Crotti et al. | A 2-GHz bandwidth, integrated transimpedance amplifier for single-photon timing applications | |
Zimmermann et al. | Integrated fiber optical receiver reducing the gap to the quantum limit | |
Ruggeri et al. | Integrated circuit for subnanosecond gating of InGaAs/InP SPAD | |
Sanzaro et al. | InGaAs/InP SPAD with monolithically integrated zinc-diffused resistor | |
Liu et al. | A 16-channel analog CMOS SiPM with on-chip front-end for D-ToF LiDAR | |
Al Disi et al. | High-count rate, low power and low noise single electron readout ASIC in 65nm CMOS technology | |
Corsi et al. | BASIC: an 8-channel Front-end ASIC for Silicon Photomultiplier Detectors | |
Wu et al. | A time-to-amplitude converter with high impedance switch topology for single-photon time-of-flight measurement | |
Wang et al. | An analog SiPM based receiver with on-chip wideband amplifier module for direct tof lidar applications | |
Oo et al. | A High-Speed Low-Noise 16-Channel CSA With Automatic Leakage Compensation In 0.35-$\mu $ m CMOS Process for APD-Based PET Detectors | |
Corsi et al. | Current-mode front-end electronics for silicon photo-multiplier detectors | |
Maj et al. | 23552-channel IC for single photon counting pixel detectors with 75 µm pitch, ENC of 89 e− rms, 19 e− rms offset spread and 3% rms gain spread | |
Tan et al. | A low-noise and high-accuracy transimpedance amplifier exploiting power-on-calibration technique for LiDAR | |
Zlatanski et al. | Sub-500-ps temporal resolution streak-mode optical sensor | |
Corsi et al. | Preliminary results from a current mode CMOS front-end circuit for silicon photomultiplier detectors | |
Xu et al. | A Near-Infrared Single-Photon Detector for Direct Time-of-Flight Measurement Using Time-to-Amplitude-Digital Hybrid Conversion Method | |
Zhou et al. | A high time-resolved front-end ASIC for APD array detector in nuclear resonant scattering experiments with synchrotron radiation | |
Dey et al. | A CMOS front-end interface ASIC for SiPM-based positron emission tomography imaging systems | |
Kleczek et al. | Comparative analysis of the readout front-end electronics implemented in deep submicron technologies | |
Kasinski et al. | TOT02, a time-over-threshold based readout chip in 180 nm CMOS process for long silicon strip detectors |