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Nugroho et al., 2008 - Google Patents

Empirical analysis of the relation between level of detail in UML models and defect density

Nugroho et al., 2008

Document ID
9274223680552990027
Author
Nugroho A
Flaton B
Chaudron M
Publication year
Publication venue
Model Driven Engineering Languages and Systems: 11th International Conference, MoDELS 2008, Toulouse, France, September 28-October 3, 2008. Proceedings 11

External Links

Snippet

This paper investigates the relation between the level of detail (LoD) in UML models and defect density of the associated implementation. We propose LoD measures that are applicable to both class-and sequence diagrams. Based on empirical data from an industrial …
Continue reading at link.springer.com (other versions)

Classifications

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    • G06Q10/00—Administration; Management
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    • G06Q10/00—Administration; Management
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