Kunz et al., 2019 - Google Patents
Investigating metal-semiconductor contacts in solar cells using magnetic field measurementsKunz et al., 2019
- Document ID
- 9176824842730835574
- Author
- Kunz O
- Paduthol A
- Slade A
- Edwards M
- Kaufmann K
- Patzold M
- Lausch D
- Trupke T
- Publication year
- Publication venue
- 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)
External Links
Snippet
While solar cells and modules are already a mature technology in mass production, contacting schemes are constantly evolving. For example, multi busbar/multi wire contacting systems are currently being developed. During the development and the production of such …
- 238000005259 measurement 0 title abstract description 19
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/02—Testing of electric apparatus, lines or components, for short-circuits, discontinuities, leakage of current, or incorrect line connection
- G01R31/024—Arrangements for indicating continuity or short-circuits in electric apparatus or lines, leakage or ground faults
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/02—Testing of electric apparatus, lines or components, for short-circuits, discontinuities, leakage of current, or incorrect line connection
- G01R31/04—Testing connections, e.g. of plugs, of non-disconnectable joints
- G01R31/043—Testing connections, e.g. of plugs, of non-disconnectable joints of releaseable connections, e.g. terminals mounted on a printed circuit board
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating magnetic variables
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Köntges et al. | Quantifying the risk of power loss in PV modules due to micro cracks | |
Van der Heide et al. | Explanation of high solar cell diode factors by nonuniform contact resistance | |
Breitenstein et al. | The reliability of thermography-and luminescence-based series resistance and saturation current density imaging | |
Shanmugam et al. | Impact of the phosphorus emitter doping profile on metal contact recombination of silicon wafer solar cells | |
Wong et al. | Quantifying edge and peripheral recombination losses in industrial silicon solar cells | |
Köntges et al. | Quantitative analysis of PV-modules by electroluminescence images for quality control | |
Kunz et al. | Investigating metal-semiconductor contacts in solar cells using magnetic field measurements | |
Gregory et al. | Nondestructive contact resistivity measurements on solar cells using the circular transmission line method | |
Müller et al. | Evaluation of determination methods of the Si/Al contact resistance of screen-printed passivated emitter and rear solar cells | |
CN106093576A (en) | A kind of electrolysis bath group insulation against ground resistor detection method and device | |
Paire et al. | Measuring sheet resistance of CIGS solar cell's window layer by spatially resolved electroluminescence imaging | |
Breitenstein et al. | Lock-in thermography-A universal tool for local analysis of solar cells | |
Du et al. | Modeling, imaging and resistance analysis for crystalline silicon photovoltaic modules failure on thermal cycle test | |
Rajput et al. | Fast extraction of front ribbon resistance of silicon photovoltaic modules using electroluminescence imaging | |
Van der Heide et al. | Error diagnosis and optimisation of c-Si solar cell processing using contact resistances determined with the Corescanner | |
EP2851696B1 (en) | Method for the extraction of recombination characteristics at metallized semiconductor surfaces | |
Hoenig et al. | New measurement method for the investigation of space charge region recombination losses induced by the metallization of silicon solar cells | |
CN106950456B (en) | A performance evaluation method of substation grounding grid based on artificial short-circuit experiment | |
Frühauf et al. | Description of the local series resistance of real solar cells by separate horizontal and vertical components | |
Breitenstein et al. | Surface potential mapping on crystalline silicon on glass solar modules | |
Herrmann et al. | Microstructure beneath screen-printed silver contacts and its correlation to metallization-induced recombination parameters | |
Urban et al. | Full analysis of series resistance components and their degradation in temperature cycling of PERC solar cells | |
CN109903258A (en) | A method and system for detecting power cable category based on grayscale matching | |
CN103015974B (en) | A kind of oil-base mud logging instrument measuring probe | |
EP3748346B1 (en) | Method for non-destructively examining an anode of an aluminium electrolysis cell |