Maunders et al., 2011 - Google Patents
Practical methods for the measurement of spatial coherence—a comparative studyMaunders et al., 2011
- Document ID
- 9164764963988469897
- Author
- Maunders C
- Dwyer C
- Tiemeijer P
- Etheridge J
- Publication year
- Publication venue
- Ultramicroscopy
External Links
Snippet
Two new methods for the measurement of transverse spatial coherence in a transmission electron microscope (TEM) are developed and applied to measure the spatial coherence in a field emission gun TEM. Measurements are made under different illumination and …
- 238000005259 measurement 0 title abstract description 66
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular type of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
- G01N21/23—Bi-refringence
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Maunders et al. | Practical methods for the measurement of spatial coherence—a comparative study | |
Hÿtch et al. | Dark-field electron holography for the measurement of geometric phase | |
Erni | Aberration-corrected imaging in transmission electron microscopy: An introduction | |
Völkl et al. | Introduction to electron holography | |
Majorovits et al. | Optimizing phase contrast in transmission electron microscopy with an electrostatic (Boersch) phase plate | |
James et al. | Practical aspects of atomic resolution imaging and analysis in STEM | |
JP5562243B2 (en) | Method, device and system for measuring nanoscale deformation | |
Smith | Development of aberration-corrected electron microscopy | |
Cosgriff et al. | Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part I:: Elastic scattering | |
Koch et al. | Off-axis and inline electron holography: A quantitative comparison | |
JP2015514974A (en) | System and method for measuring strain in matter with high spatial resolution | |
JP6940985B2 (en) | How to image a sample using tycography | |
Nellist et al. | Optical sectioning and confocal imaging and analysis in the transmission electron microscope | |
Winkler et al. | Direct measurement of electrostatic potentials at the atomic scale: A conceptual comparison between electron holography and scanning transmission electron microscopy | |
Dwyer et al. | Method to measure spatial coherence of subangstrom electron beams | |
Ophus et al. | Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples | |
Agarwal et al. | A nanofabricated, monolithic, path-separated electron interferometer | |
Wu et al. | Correlative micro-diffraction and differential phase contrast study of mean inner potential and subtle beam-specimen interaction | |
Adaniya et al. | Development of a SEM-based low-energy in-line electron holography microscope for individual particle imaging | |
Röder et al. | Realization of a tilted reference wave for electron holography by means of a condenser biprism | |
Kamimura et al. | 10-kV diffractive imaging using newly developed electron diffraction microscope | |
Lehtinen et al. | Numerical correction of anti-symmetric aberrations in single HRTEM images of weakly scattering 2D-objects | |
Smith | Progress and perspectives for atomic-resolution electron microscopy | |
Ramasse et al. | Diagnosis of aberrations from crystalline samples in scanning transmission electron microscopy | |
US10629410B2 (en) | Electron microscope for magnetic field measurement and magnetic field measurement method |