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Alexandrescu et al., 2012 - Google Patents

Towards optimized functional evaluation of see-induced failures in complex designs

Alexandrescu et al., 2012

Document ID
8870837374618206097
Author
Alexandrescu D
Costenaro E
Publication year
Publication venue
2012 IEEE 18th International On-Line Testing Symposium (IOLTS)

External Links

Snippet

Single Event Effects strongly impact the reliability of electronic circuits and systems, requiring careful SER characterization and adequately sized mitigation strategy. The SER study aims at providing relevant information about the circuit behavior in the specified …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

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    • G06F17/5009—Computer-aided design using simulation
    • G06F17/5022—Logic simulation, e.g. for logic circuit operation
    • G06F17/5031—Timing analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequence
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequence by preliminary fault modelling, e.g. analysis, simulation
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    • G—PHYSICS
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    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
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    • G06F17/5045—Circuit design
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
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    • G06F11/00—Error detection; Error correction; Monitoring
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