[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Tartari et al., 2003 - Google Patents

On the angular dependence of L x-ray production cross sections followingphotoionization at an energy of 59.54 keV

Tartari et al., 2003

View PDF
Document ID
8092879533470455968
Author
Tartari A
Baraldi C
Casnati E
Da Re A
Fernandez J
Taioli S
Publication year
Publication venue
Journal of Physics B: Atomic, Molecular and Optical Physics

External Links

Snippet

The anisotropy of L x-ray fluorescence induced by 59.54 keV unpolarized photons is investigated by means of an experimental procedure which allows the relative L x-ray production cross section to be evaluated without taking account of the angular set-up and …
Continue reading at www.academia.edu (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material and measuring the absorption
    • G01N23/08—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material and measuring the absorption using electric detection means
    • G01N23/16—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material and measuring the absorption using electric detection means the material being a moving sheet or a sheet or tube examined by a scanning probe
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam with incident electron beam
    • G01N23/2252—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam with incident electron beam and measuring excited X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/02—Dosimeters
    • G01T1/10—Luminescent dosimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/02—Dosimeters
    • G01T1/026—Semiconductor dose-rate meters

Similar Documents

Publication Publication Date Title
Tartari et al. On the angular dependence of L x-ray production cross sections followingphotoionization at an energy of 59.54 keV
Ménesguen et al. Experimental determination of the X-ray atomic fundamental parameters of nickel
Wellhöfer et al. Performance of the monochromator beamline at FLASH
Rahangdale et al. Determination of subshell-resolved L-shell-ionization cross sections of gold induced by 15–40-keV electrons
Zhao et al. Measurements of L-shell X-ray production cross-sections of Ag and Sb by low-energy electron impact
Girones et al. The use of high-energy X-ray generators for TID testing of electronic devices
Achasov et al. Study of the process e+ e-→ ω π 0→ π+ π-π 0 π 0 in the energy range 1.05–2.00 GeV with SND
Montanari et al. Stopping power of hydrogen in hafnium and the importance of relativistic 4 f electrons
Wu et al. Measurements of Lα, Lβ x-ray production cross sections of Pb by 16–40 keV electron impact
Zhu et al. Measurements of the K-shell ionization cross sections of Si by 3–25-keV electron impact using the thick-target method
Kumar et al. L x-ray production cross sections in Th and U at 17.8, 25.8 and 46.9 keV photon energies
Madsen et al. Anomalous electron scattering from 142, 146, 150Nd
An et al. Inverse problem in the thick-target method of measurements of inner-shell ionization cross sections by electron or positron impact
Kumar et al. Alignment of M i (i= 3–5) subshell vacancy states in Au 79, Bi 83, Th 90, and U 92 following photoionization by unpolarized Mn K x rays
Pérez et al. Experimental determination of multiple ionization cross sections in Si by electron impact
Li et al. Bremsstrahlung of 5–25-keV electron impact with Al, Cu, Ag, Te, and Au thick solid targets with no polarization contribution
Torii et al. Some characteristics of a solid state detector in the soft X-ray region
Behrens et al. A TLD-based few-channel spectrometer for mixed photon, electron, and ion fields with high fluence rates
Singh et al. Measurement of the angular distribution of thick target bremsstrahlung produced by 10–25 keV electrons incident on Ti and Cu targets
Tarbutt et al. Measurement of the ground-state Lambshift of hydrogen-like Ti21+
Ahmed et al. Calculation of beam hardening in industrial X-ray computed tomography and its correction using filtration and linearization methods
Ertugrul et al. Measurement of Kβ2'/Kβ1'andKβ2'/Kα1 relative intensities with 57Co forheavy elements
Ogawa et al. Analysis of fragmentation excitation functions of lead by carbon ions up to 400 MeV/u
Novotný et al. Radiation damage study of thin YAG: Ce scintillator using low-energy protons
Inoyatov et al. Experimental determinations of the energy of the 9.4 keV (M1+ E2) nuclear transition in 83Kr and the Kr electron binding energies in different matrices by ICES method