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He et al., 2023 - Google Patents

A General Layout Pattern Clustering Using Geometric Matching-based Clip Relocation and Lower-bound Aided Optimization

He et al., 2023

Document ID
794945679038904139
Author
He X
Wang Y
Fu Z
Wang Y
Guo Y
Publication year
Publication venue
ACM Transactions on Design Automation of Electronic Systems

External Links

Snippet

With the continuous shrinking of feature size, detection of lithography hotspots has been raised as one of the major concerns in Design-for-Manufacturability (DFM) of semiconductor processing. Hotspot detection, along with other DFM measures, trades off turnaround time …
Continue reading at dl.acm.org (other versions)

Classifications

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    • G06F17/5068Physical circuit design, e.g. layout for integrated circuits or printed circuit boards
    • G06F17/5081Layout analysis, e.g. layout verification, design rule check
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    • G06COMPUTING; CALCULATING; COUNTING
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