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Hsu et al., 1976 - Google Patents

Temperature dependence of the resistivity and the Hall coefficient of thin bismuth film

Hsu et al., 1976

Document ID
7808816524792057956
Author
Hsu L
Chang Y
Young C
Tseng P
Publication year
Publication venue
Journal of Applied Physics

External Links

Snippet

Temperature dependence measurements of Hall coefficients and resistivity were carried out on thin bismuth films (∼ 1500 Å thickness) of various heat‐treating histories. The results show that the perfectness of the thin‐film crystal correlates with the temperature dependence …
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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating the impedance of the material
    • G01N27/04Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating the impedance of the material by investigating resistance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables

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